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Stephen Jesse

Showing results (61-70 of 162) with videos related to

Pageof 17
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ACS Nano|March 6, 2025
Nanoscale Polarization-Dependent Young's Modulus of Ferroelectric BaTiO<sub>3</sub> Single CrystalsMarti Checa, Christina Stefani, Kyle Kelley, et al.
Nanotechnology|February 12, 2016
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopyLiam Collins, Alex Belianinov, Suhas Somnath, et al.
Small (Weinheim an Der Bergstrasse, Germany)|February 16, 2012
Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imagingSenli Guo, Santiago D Solares, Vadym Mochalin, et al.
Advanced Materials (Deerfield Beach, Fla.)|June 13, 2023
Top-Down Fabrication of Atomic Patterns in Twisted Bilayer GrapheneOndrej Dyck, Sinchul Yeom, Andrew R Lupini, et al.
Advanced Materials (Deerfield Beach, Fla.)|January 29, 2011
Reduced coercive field in BiFeO₃ thin films through domain engineeringVilas Shelke, Dipanjan Mazumdar, Gopalan Srinivasan, et al.
Science Advances|October 11, 2019
Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy studyMaxim Ziatdinov, Ondrej Dyck, Xin Li, et al.
ACS Nano|November 10, 2010
Decoupling electrochemical reaction and diffusion processes in ionically-conductive solids on the nanometer scaleNina Balke, Stephen Jesse, Yoongu Kim, et al.
Nanotechnology|January 5, 2017
Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopyNina Balke, Stephen Jesse, Ben Carmichael, et al.
Nanophotonics (Berlin, Germany)|December 5, 2024
Closed-loop electron-beam-induced spectroscopy and nanofabrication around individual quantum emittersJawaher Almutlaq, Kyle P Kelley, Hyeongrak Choi, et al.
ACS Nano|January 7, 2015
Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopyQian Li, Stephen Jesse, Alexander Tselev, et al.
Pageof 17

Showing results (61-70 of 162) with videos related to

Sort By:
Pageof 17
ACS Nano|March 6, 2025
Nanoscale Polarization-Dependent Young's Modulus of Ferroelectric BaTiO<sub>3</sub> Single CrystalsMarti Checa, Christina Stefani, Kyle Kelley, et al.
Nanotechnology|February 12, 2016
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopyLiam Collins, Alex Belianinov, Suhas Somnath, et al.
Small (Weinheim an Der Bergstrasse, Germany)|February 16, 2012
Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imagingSenli Guo, Santiago D Solares, Vadym Mochalin, et al.
Advanced Materials (Deerfield Beach, Fla.)|June 13, 2023
Top-Down Fabrication of Atomic Patterns in Twisted Bilayer GrapheneOndrej Dyck, Sinchul Yeom, Andrew R Lupini, et al.
Advanced Materials (Deerfield Beach, Fla.)|January 29, 2011
Reduced coercive field in BiFeO₃ thin films through domain engineeringVilas Shelke, Dipanjan Mazumdar, Gopalan Srinivasan, et al.
Science Advances|October 11, 2019
Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy studyMaxim Ziatdinov, Ondrej Dyck, Xin Li, et al.
ACS Nano|November 10, 2010
Decoupling electrochemical reaction and diffusion processes in ionically-conductive solids on the nanometer scaleNina Balke, Stephen Jesse, Yoongu Kim, et al.
Nanotechnology|January 5, 2017
Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopyNina Balke, Stephen Jesse, Ben Carmichael, et al.
Nanophotonics (Berlin, Germany)|December 5, 2024
Closed-loop electron-beam-induced spectroscopy and nanofabrication around individual quantum emittersJawaher Almutlaq, Kyle P Kelley, Hyeongrak Choi, et al.
ACS Nano|January 7, 2015
Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopyQian Li, Stephen Jesse, Alexander Tselev, et al.
Pageof 17