Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
The Journal of Physical Chemistry. B|September 10, 2013
Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ionsMartin P Seah, Steve J Spencer, Alex G Shard
ACS Applied Materials & Interfaces|January 30, 2016
Covalent Carbene Functionalization of Graphene: Toward Chemical Band-Gap ManipulationToby Sainsbury, Melissa Passarelli, Mira Naftaly, et al.
Physical Chemistry Chemical Physics : PCCP|May 4, 2016
Extending the plasmonic lifetime of tip-enhanced Raman spectroscopy probesNaresh Kumar, Steve J Spencer, Dario Imbraguglio, et al.
Biointerphases|May 10, 2015
Quantifying ligand-cell interactions and determination of the surface concentrations of ligands on hydrogel films: The measurement challengeMeike V Beer, Kathrin Hahn, Sylvia Diederichs, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|November 6, 2020
Electrocatalytic Behavior of PtCu Clusters Produced by Nanoparticle Beam DepositionMaria Chiara Spadaro, Jo J L Humphrey, Rongsheng Cai, et al.
Nano Letters|February 10, 2015
Nucleation control for large, single crystalline domains of monolayer hexagonal boron nitride via Si-doped Fe catalystsSabina Caneva, Robert S Weatherup, Bernhard C Bayer, et al.
Analytical Chemistry|August 18, 2012
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory studyAlexander G Shard, Rasmus Havelund, Martin P Seah, et al.
Biosensors & Bioelectronics|January 4, 2011
Chemical and biological characterisation of a sensor surface for bioprocess monitoringJonathan D Moore, Miguel A Perez-Pardo, Jonathan F Popplewell, et al.
The Journal of Physical Chemistry. B|July 24, 2015
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory StudyAlexander G Shard, Rasmus Havelund, Steve J Spencer, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|December 7, 2020
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethyleneBenjamen P Reed, David J H Cant, Steve J Spencer, et al.
Pageof 1