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Steven J Choquette

Showing results (1-10 of 9) with videos related to

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Applied Spectroscopy|June 7, 2011
Automated spectral smoothing with spatially adaptive penalized least squaresAaron A Urbas, Steven J Choquette
Analytical Chemistry|March 8, 2003
Rare-earth glass reference materials for near-infrared spectrometry: correcting and exploiting temperature dependenciesSteven J Choquette, Lindsey O'Neal, David L Duewer
Applied Spectroscopy|August 21, 2007
Requirements for relative intensity correction of Raman spectra obtained by column-summing charge-coupled device dataWilbur S Hurst, Steven J Choquette, Edgar S Etz
Biotechniques|August 9, 2008
Use of Standard Reference Material 2242 (Relative Intensity Correction Standard for Raman Spectroscopy) for microarray scanner qualificationMary B Satterfield, Marc L Salit, Steven J Choquette
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|March 17, 2020
NIST Reference Materials: Utility and FutureSteven J Choquette, David L Duewer, Katherine E Sharpless
Applied Spectroscopy|May 20, 2005
Standard reference material 2036 near-infrared reflection wavelength standardSteven J Choquette, David L Duewer, Leonard M Hanssen, et al.
Journal of the Air & Waste Management Association (1995)|June 22, 2013
Temperature measurement and optical path-length bias improvement modifications to National Institute of Standards and Technology ozone reference standardsJames E Norris, Steven J Choquette, Joele Viallon, et al.
Applied Spectroscopy|March 3, 2007
Relative intensity correction of Raman spectrometers: NIST SRMs 2241 through 2243 for 785 nm, 532 nm, and 488 nm/514.5 nm excitationSteven J Choquette, Edgar S Etz, Wilbur S Hurst, et al.
Cytometry. Part a : the Journal of the International Society for Analytical Cytology|August 19, 2014
An automated protocol for performance benchmarking a widefield fluorescence microscopeMichael Halter, Elianna Bier, Paul C DeRose, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Applied Spectroscopy|June 7, 2011
Automated spectral smoothing with spatially adaptive penalized least squaresAaron A Urbas, Steven J Choquette
Analytical Chemistry|March 8, 2003
Rare-earth glass reference materials for near-infrared spectrometry: correcting and exploiting temperature dependenciesSteven J Choquette, Lindsey O'Neal, David L Duewer
Applied Spectroscopy|August 21, 2007
Requirements for relative intensity correction of Raman spectra obtained by column-summing charge-coupled device dataWilbur S Hurst, Steven J Choquette, Edgar S Etz
Biotechniques|August 9, 2008
Use of Standard Reference Material 2242 (Relative Intensity Correction Standard for Raman Spectroscopy) for microarray scanner qualificationMary B Satterfield, Marc L Salit, Steven J Choquette
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|March 17, 2020
NIST Reference Materials: Utility and FutureSteven J Choquette, David L Duewer, Katherine E Sharpless
Applied Spectroscopy|May 20, 2005
Standard reference material 2036 near-infrared reflection wavelength standardSteven J Choquette, David L Duewer, Leonard M Hanssen, et al.
Journal of the Air & Waste Management Association (1995)|June 22, 2013
Temperature measurement and optical path-length bias improvement modifications to National Institute of Standards and Technology ozone reference standardsJames E Norris, Steven J Choquette, Joele Viallon, et al.
Applied Spectroscopy|March 3, 2007
Relative intensity correction of Raman spectrometers: NIST SRMs 2241 through 2243 for 785 nm, 532 nm, and 488 nm/514.5 nm excitationSteven J Choquette, Edgar S Etz, Wilbur S Hurst, et al.
Cytometry. Part a : the Journal of the International Society for Analytical Cytology|August 19, 2014
An automated protocol for performance benchmarking a widefield fluorescence microscopeMichael Halter, Elianna Bier, Paul C DeRose, et al.
Pageof 1