Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Stuart Kearns

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2018
Evaluating X-Ray Microanalysis Phase Maps Using Principal Component AnalysisBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)Ben Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 17, 2015
Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate MineralsBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 6, 2016
Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold FingerBen Buse, Stuart Kearns, Charles Clapham, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018
Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2018
Evaluating X-Ray Microanalysis Phase Maps Using Principal Component AnalysisBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)Ben Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 17, 2015
Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate MineralsBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 6, 2016
Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold FingerBen Buse, Stuart Kearns, Charles Clapham, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018
Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.
Pageof 1