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Sung Heo

Showing results (21-30 of 41) with videos related to

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Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|October 10, 2006
Interpretation of the odd-even behavior for the emergence of ferroelectricity and antiferroelectricity in bent-core mesogensKoushi Nishida, Mojca Cepic, Won Jeon Kim, et al.
Scientific Reports|May 6, 2017
Device performance enhancement via a Si-rich silicon oxynitride buffer layer for the organic photodetecting deviceSung Heo, Jooho Lee, Seong Heon Kim, et al.
ACS Applied Materials & Interfaces|October 28, 2016
Protective Oxide Coating for Ionic Conductive Solid Electrolyte InterphaseYong Su Kim, Seong Heon Kim, Gyusung Kim, et al.
Journal of the American Chemical Society|August 4, 2005
Odd-even behavior of ferroelectricity and antiferroelectricity in two homologous series of bent-core mesogensSeng Kue Lee, Sung Heo, Jong Gun Lee, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|October 13, 2007
Polar structures in binary mixtures of bent-core liquid crystals showing ferroelectric and antiferroelectric B2 phasesYuya Niigawa, Koushi Nishida, Won Jeon Kim, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|October 9, 2024
Microscopic Origin of Polarity-Dependent V<sub>TH</sub> Shift in Amorphous Chalcogenides for 3D Self-Selecting MemoryHa-Jun Sung, Minwoo Choi, Zhe Wu, et al.
Physical Chemistry Chemical Physics : PCCP|December 12, 2017
Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
Physical Chemistry Chemical Physics : PCCP|January 6, 2018
Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
ACS Applied Materials & Interfaces|September 28, 2020
In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron SpectroscopyDong-Jin Yun, Youngjun Yun, Jiyoul Lee, et al.
Small Methods|December 20, 2021
Bevel Structure Based XPS Analysis as a Non-Destructive Chemical Probe for Complex Interfacial Structures of Organic SemiconductorsDong-Jin Yun, Seunghyup Lee, Seong Heon Kim, et al.
Pageof 5

Showing results (21-30 of 41) with videos related to

Sort By:
Pageof 5
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|October 10, 2006
Interpretation of the odd-even behavior for the emergence of ferroelectricity and antiferroelectricity in bent-core mesogensKoushi Nishida, Mojca Cepic, Won Jeon Kim, et al.
Scientific Reports|May 6, 2017
Device performance enhancement via a Si-rich silicon oxynitride buffer layer for the organic photodetecting deviceSung Heo, Jooho Lee, Seong Heon Kim, et al.
ACS Applied Materials & Interfaces|October 28, 2016
Protective Oxide Coating for Ionic Conductive Solid Electrolyte InterphaseYong Su Kim, Seong Heon Kim, Gyusung Kim, et al.
Journal of the American Chemical Society|August 4, 2005
Odd-even behavior of ferroelectricity and antiferroelectricity in two homologous series of bent-core mesogensSeng Kue Lee, Sung Heo, Jong Gun Lee, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|October 13, 2007
Polar structures in binary mixtures of bent-core liquid crystals showing ferroelectric and antiferroelectric B2 phasesYuya Niigawa, Koushi Nishida, Won Jeon Kim, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|October 9, 2024
Microscopic Origin of Polarity-Dependent V<sub>TH</sub> Shift in Amorphous Chalcogenides for 3D Self-Selecting MemoryHa-Jun Sung, Minwoo Choi, Zhe Wu, et al.
Physical Chemistry Chemical Physics : PCCP|December 12, 2017
Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
Physical Chemistry Chemical Physics : PCCP|January 6, 2018
Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
ACS Applied Materials & Interfaces|September 28, 2020
In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron SpectroscopyDong-Jin Yun, Youngjun Yun, Jiyoul Lee, et al.
Small Methods|December 20, 2021
Bevel Structure Based XPS Analysis as a Non-Destructive Chemical Probe for Complex Interfacial Structures of Organic SemiconductorsDong-Jin Yun, Seunghyup Lee, Seong Heon Kim, et al.
Pageof 5