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Sungsik Lee

Showing results (1-10 of 93) with videos related to

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Scientific Reports|May 24, 2024
Analysis on charge-retention characteristics of sub-threshold synaptic IGZO thin-film transistors with defective gate oxidesSungsik Lee
Membranes|December 23, 2021
An Empirical Modeling of Gate Voltage-Dependent Behaviors of Amorphous Oxide Semiconductor Thin-Film Transistors including Consideration of Contact Resistance and Disorder Effects at Room TemperatureSungsik Lee
Science (New York, N.Y.)|November 16, 2016
Subthreshold Schottky-barrier thin-film transistors with ultralow power and high intrinsic gainSungsik Lee, Arokia Nathan
Scientific Reports|March 3, 2016
Conduction Threshold in Accumulation-Mode InGaZnO Thin Film TransistorsSungsik Lee, Arokia Nathan
Scientific Reports|March 1, 2019
Wavelength-dependent Optical Instability Mechanisms and Decay Kinetics in Amorphous Oxide Thin-Film DevicesJunyoung Bae, Inkyung Jeong, Sungsik Lee
Scientific Reports|April 17, 2025
A read voltage dependent synaptic characteristics of sub-threshold thin film transistors with a hf doped ZnO active layerJeongseok Pi, Danyoung Cha, Sungsik Lee
Scientific Reports|November 11, 2025
Programming pulse width dependent charge retention characteristics of low-power synaptic thin film transistorsDanyoung Cha, Jeongseok Pi, Sungsik Lee
ACS Applied Materials & Interfaces|May 23, 2025
Enhanced Retention Characteristics of Subthreshold Hf-ZnO Synaptic Pass-Transistors with Ultralow Power ConsumptionDanyoung Cha, Jeongseok Pi, Sungsik Lee
Scientific Reports|December 12, 2022
Operating region-dependent characteristics of weight updates in synaptic In-Ga-Zn-O thin-film transistorsDanyoung Cha, Yeonsu Kang, Sungsik Lee
Scientific Reports|October 9, 2015
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse SpectroscopySungsik Lee, Arokia Nathan, Sanghun Jeon, et al.
Pageof 10

Showing results (1-10 of 93) with videos related to

Sort By:
Pageof 10
Scientific Reports|May 24, 2024
Analysis on charge-retention characteristics of sub-threshold synaptic IGZO thin-film transistors with defective gate oxidesSungsik Lee
Membranes|December 23, 2021
An Empirical Modeling of Gate Voltage-Dependent Behaviors of Amorphous Oxide Semiconductor Thin-Film Transistors including Consideration of Contact Resistance and Disorder Effects at Room TemperatureSungsik Lee
Science (New York, N.Y.)|November 16, 2016
Subthreshold Schottky-barrier thin-film transistors with ultralow power and high intrinsic gainSungsik Lee, Arokia Nathan
Scientific Reports|March 3, 2016
Conduction Threshold in Accumulation-Mode InGaZnO Thin Film TransistorsSungsik Lee, Arokia Nathan
Scientific Reports|March 1, 2019
Wavelength-dependent Optical Instability Mechanisms and Decay Kinetics in Amorphous Oxide Thin-Film DevicesJunyoung Bae, Inkyung Jeong, Sungsik Lee
Scientific Reports|April 17, 2025
A read voltage dependent synaptic characteristics of sub-threshold thin film transistors with a hf doped ZnO active layerJeongseok Pi, Danyoung Cha, Sungsik Lee
Scientific Reports|November 11, 2025
Programming pulse width dependent charge retention characteristics of low-power synaptic thin film transistorsDanyoung Cha, Jeongseok Pi, Sungsik Lee
ACS Applied Materials & Interfaces|May 23, 2025
Enhanced Retention Characteristics of Subthreshold Hf-ZnO Synaptic Pass-Transistors with Ultralow Power ConsumptionDanyoung Cha, Jeongseok Pi, Sungsik Lee
Scientific Reports|December 12, 2022
Operating region-dependent characteristics of weight updates in synaptic In-Ga-Zn-O thin-film transistorsDanyoung Cha, Yeonsu Kang, Sungsik Lee
Scientific Reports|October 9, 2015
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse SpectroscopySungsik Lee, Arokia Nathan, Sanghun Jeon, et al.
Pageof 10