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Sensors (Basel, Switzerland)|February 24, 2019
An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO₂ LayerArtur Zarzycki, July Galeano, Sylwester Bargiel, et al.
Acta Biochimica Polonica|September 30, 2003
Desorption/ionization on silicon for small molecules:a promising alternative to MALDI TOFAgnieszka Kraj, Tomasz Dylag, Anna Gorecka-Drzazga, et al.
Micromachines|March 16, 2019
Technological Platform for Vertical Multi-Wafer Integration of Microscanners and Micro-Optical ComponentsSylwester Bargiel, Maciej Baranski, Maik Wiemer, et al.
Optics Express|June 13, 2014
A simple method for quality evaluation of micro-optical components based on 3D IPSF measurementMaciej Baranski, Stephane Perrin, Nicolas Passilly, et al.
Applied Optics|September 15, 2015
Micro-optical design of a three-dimensional microlens scanner for vertically integrated micro-opto-electro-mechanical systemsMaciej Baranski, Sylwester Bargiel, Nicolas Passilly, et al.
Optics Letters|September 23, 2015
Impact of mirror spider legs on imaging quality in Mirau micro-interferometryJustine Lullin, Stephane Perrin, Maciej Baranski, et al.
Optics Express|February 25, 2022
High-fidelity glass micro-axicons fabricated by laser-assisted wet etchingJean-Loup Skora, Olivier Gaiffe, Sylwester Bargiel, et al.
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