Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

T J Pennycook

Showing results (1-10 of 7) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|November 9, 2023
On central focusing for contrast optimization in direct electron ptychography of thick samplesC Gao, C Hofer, T J Pennycook
Ultramicroscopy|November 27, 2021
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applicationsD Jannis, C Hofer, C Gao, et al.
Nature Communications|June 5, 2015
Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioningH Yang, J G Lozano, T J Pennycook, et al.
Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Structure evolution of h.c.p./c.c.p. metal oxide interfaces in solid-state reactionsC Li, G Habler, T Griffiths, et al.
Nanoscale Research Letters|October 18, 2015
Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn(4+)-Rich Antiphase BoundariesI MacLaren, B Sala, S M L Andersson, et al.
Nature Communications|August 27, 2016
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructuresH Yang, R N Rutte, L Jones, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|November 9, 2023
On central focusing for contrast optimization in direct electron ptychography of thick samplesC Gao, C Hofer, T J Pennycook
Ultramicroscopy|November 27, 2021
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applicationsD Jannis, C Hofer, C Gao, et al.
Nature Communications|June 5, 2015
Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioningH Yang, J G Lozano, T J Pennycook, et al.
Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Structure evolution of h.c.p./c.c.p. metal oxide interfaces in solid-state reactionsC Li, G Habler, T Griffiths, et al.
Nanoscale Research Letters|October 18, 2015
Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn(4+)-Rich Antiphase BoundariesI MacLaren, B Sala, S M L Andersson, et al.
Nature Communications|August 27, 2016
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructuresH Yang, R N Rutte, L Jones, et al.
Pageof 1