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Journal of Microscopy
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January 26, 2010
Atom probe tomography analysis of poly(3-alkylthiophene)s
T J Prosa, S Kostrna Keeney, T F Kelly
Ultramicroscopy
|
January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography
D J Larson, T J Prosa, B P Geiser, et al.
Journal of Microscopy
|
July 16, 2010
Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomography
T J Prosa, R Alvis, L Tsakalakos, et al.
Journal of Microscopy
|
December 2, 2010
Evolution of tip shape during field evaporation of complex multilayer structures
E A Marquis, B P Geiser, T J Prosa, et al.
Journal of Microscopy
|
August 22, 2012
Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography
M E Greene, T F Kelly, D J Larson, et al.
Ultramicroscopy
|
January 8, 2013
Analysis of implanted silicon dopant profiles
T J Prosa, D Olson, B Geiser, et al.
Journal of Microscopy
|
December 16, 2010
Improvements in planar feature reconstructions in atom probe tomography
D J Larson, B P Geiser, T J Prosa, et al.
Nanotechnology
|
May 4, 2012
Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography
Satyanarayana V N T Kuchibhatla, V Shutthanandan, T J Prosa, et al.
Nature Communications
|
May 27, 2017
Atomic-scale age resolution of planetary events
L F White, J R Darling, D E Moser, et al.
Ultramicroscopy
|
March 10, 2015
Encapsulation method for atom probe tomography analysis of nanoparticles
D J Larson, A D Giddings, Y Wu, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 10) with videos related to
Sort By:
Page
of 1
Journal of Microscopy
|
January 26, 2010
Atom probe tomography analysis of poly(3-alkylthiophene)s
T J Prosa, S Kostrna Keeney, T F Kelly
Ultramicroscopy
|
January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography
D J Larson, T J Prosa, B P Geiser, et al.
Journal of Microscopy
|
July 16, 2010
Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomography
T J Prosa, R Alvis, L Tsakalakos, et al.
Journal of Microscopy
|
December 2, 2010
Evolution of tip shape during field evaporation of complex multilayer structures
E A Marquis, B P Geiser, T J Prosa, et al.
Journal of Microscopy
|
August 22, 2012
Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography
M E Greene, T F Kelly, D J Larson, et al.
Ultramicroscopy
|
January 8, 2013
Analysis of implanted silicon dopant profiles
T J Prosa, D Olson, B Geiser, et al.
Journal of Microscopy
|
December 16, 2010
Improvements in planar feature reconstructions in atom probe tomography
D J Larson, B P Geiser, T J Prosa, et al.
Nanotechnology
|
May 4, 2012
Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography
Satyanarayana V N T Kuchibhatla, V Shutthanandan, T J Prosa, et al.
Nature Communications
|
May 27, 2017
Atomic-scale age resolution of planetary events
L F White, J R Darling, D E Moser, et al.
Ultramicroscopy
|
March 10, 2015
Encapsulation method for atom probe tomography analysis of nanoparticles
D J Larson, A D Giddings, Y Wu, et al.
Page
of 1