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T J Ruggles

Showing results (1-10 of 5) with videos related to

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Ultramicroscopy|June 12, 2013
Estimations of bulk geometrically necessary dislocation density using high resolution EBSDT J Ruggles, D T Fullwood
Ultramicroscopy|March 18, 2016
The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopyT J Ruggles, T M Rampton, A Khosravani, et al.
Ultramicroscopy|September 15, 2018
New levels of high angular resolution EBSD performance via inverse compositional Gauss-Newton based digital image correlationT J Ruggles, G F Bomarito, R L Qiu, et al.
Ultramicroscopy|January 11, 2020
Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reductionT J Ruggles, Y S J Yoo, B E Dunlap, et al.
Journal of Microscopy|July 4, 2015
Analysis of traction-free assumption in high-resolution EBSD measurementsT J Hardin, T J Ruggles, D P Koch, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|June 12, 2013
Estimations of bulk geometrically necessary dislocation density using high resolution EBSDT J Ruggles, D T Fullwood
Ultramicroscopy|March 18, 2016
The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopyT J Ruggles, T M Rampton, A Khosravani, et al.
Ultramicroscopy|September 15, 2018
New levels of high angular resolution EBSD performance via inverse compositional Gauss-Newton based digital image correlationT J Ruggles, G F Bomarito, R L Qiu, et al.
Ultramicroscopy|January 11, 2020
Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reductionT J Ruggles, Y S J Yoo, B E Dunlap, et al.
Journal of Microscopy|July 4, 2015
Analysis of traction-free assumption in high-resolution EBSD measurementsT J Hardin, T J Ruggles, D P Koch, et al.
Pageof 1