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T Mélin

Showing results (1-10 of 7) with videos related to

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Physical Review Letters|June 1, 2004
Probing nanoscale dipole-dipole interactions by electric force microscopyT Mélin, H Diesinger, D Deresmes, et al.
Nanotechnology|May 11, 2010
Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopyE Palleau, L Ressier, Ł Borowik, et al.
Ultramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.
Ultramicroscopy|March 18, 2008
Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setupH Diesinger, D Deresmes, J-P Nys, et al.
The Review of Scientific Instruments|April 5, 2011
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopyT Mélin, S Barbet, H Diesinger, et al.
Physical Review Letters|February 21, 2006
Comment on "electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy"M Zdrojek, T Mélin, H Diesinger, et al.
Nanoscale|April 3, 2020
Conductance switching at the nanoscale of diarylethene derivative self-assembled monolayers on La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub>L Thomas, D Guérin, B Quinard, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Physical Review Letters|June 1, 2004
Probing nanoscale dipole-dipole interactions by electric force microscopyT Mélin, H Diesinger, D Deresmes, et al.
Nanotechnology|May 11, 2010
Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopyE Palleau, L Ressier, Ł Borowik, et al.
Ultramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.
Ultramicroscopy|March 18, 2008
Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setupH Diesinger, D Deresmes, J-P Nys, et al.
The Review of Scientific Instruments|April 5, 2011
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopyT Mélin, S Barbet, H Diesinger, et al.
Physical Review Letters|February 21, 2006
Comment on "electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy"M Zdrojek, T Mélin, H Diesinger, et al.
Nanoscale|April 3, 2020
Conductance switching at the nanoscale of diarylethene derivative self-assembled monolayers on La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub>L Thomas, D Guérin, B Quinard, et al.
Pageof 1