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Nature
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April 24, 2010
Substrate-enhanced supercooling in AuSi eutectic droplets
T U Schülli, R Daudin, G Renaud, et al.
Journal of Nanoscience and Nanotechnology
|
March 10, 2012
A combined In situ grazing incidence small angle X-ray scattering and grazing incidence X-ray diffraction study of the growth of Ge Islands on pit-patterned Si(001) substrates
M-I Richard, T U Schülli, G Renaud, et al.
Physical Review Letters
|
May 21, 2005
Strain induced changes in the magnetic phase diagram of metamagnetic heteroepitaxial EuSe/PbSe(1-x)Tex multilayers
R T Lechner, G Springholz, T U Schülli, et al.
Journal of Synchrotron Radiation
|
April 29, 2011
Three-dimensional diffraction mapping by tuning the X-ray energy
T W Cornelius, D Carbone, V L R Jacques, et al.
Optics Express
|
January 16, 2019
X-ray zoom lens allows for energy scans in X-ray microscopy
E Kornemann, T Zhou, O Márkus, et al.
The Review of Scientific Instruments
|
December 3, 2013
Compact ultrahigh vacuum sample environments for x-ray nanobeam diffraction and imaging
P G Evans, G Chahine, R Grifone, et al.
Physical Review Letters
|
March 14, 2003
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer
T U Schülli, J Stangl, Z Zhong, et al.
Nanotechnology
|
February 29, 2012
Growth and relaxation processes in Ge nanocrystals on free-standing Si(001) nanopillars
G Kozlowski, P Zaumseil, M A Schubert, et al.
Nanotechnology
|
August 17, 2012
The role of SiGe buffer in growth and relaxation of Ge on free-standing Si(001) nano-pillars
P Zaumseil, G Kozlowski, M A Schubert, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
July 19, 2012
Nanoscale distortions of Si quantum wells in Si/SiGe quantum-electronic heterostructures
P G Evans, D E Savage, J R Prance, et al.
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of 2
Search research articles
Search
Showing results (1-10 of 13) with videos related to
Sort By:
Page
of 2
Nature
|
April 24, 2010
Substrate-enhanced supercooling in AuSi eutectic droplets
T U Schülli, R Daudin, G Renaud, et al.
Journal of Nanoscience and Nanotechnology
|
March 10, 2012
A combined In situ grazing incidence small angle X-ray scattering and grazing incidence X-ray diffraction study of the growth of Ge Islands on pit-patterned Si(001) substrates
M-I Richard, T U Schülli, G Renaud, et al.
Physical Review Letters
|
May 21, 2005
Strain induced changes in the magnetic phase diagram of metamagnetic heteroepitaxial EuSe/PbSe(1-x)Tex multilayers
R T Lechner, G Springholz, T U Schülli, et al.
Journal of Synchrotron Radiation
|
April 29, 2011
Three-dimensional diffraction mapping by tuning the X-ray energy
T W Cornelius, D Carbone, V L R Jacques, et al.
Optics Express
|
January 16, 2019
X-ray zoom lens allows for energy scans in X-ray microscopy
E Kornemann, T Zhou, O Márkus, et al.
The Review of Scientific Instruments
|
December 3, 2013
Compact ultrahigh vacuum sample environments for x-ray nanobeam diffraction and imaging
P G Evans, G Chahine, R Grifone, et al.
Physical Review Letters
|
March 14, 2003
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer
T U Schülli, J Stangl, Z Zhong, et al.
Nanotechnology
|
February 29, 2012
Growth and relaxation processes in Ge nanocrystals on free-standing Si(001) nanopillars
G Kozlowski, P Zaumseil, M A Schubert, et al.
Nanotechnology
|
August 17, 2012
The role of SiGe buffer in growth and relaxation of Ge on free-standing Si(001) nano-pillars
P Zaumseil, G Kozlowski, M A Schubert, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
July 19, 2012
Nanoscale distortions of Si quantum wells in Si/SiGe quantum-electronic heterostructures
P G Evans, D E Savage, J R Prance, et al.
Page
of 2