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T U Schülli

Showing results (1-10 of 13) with videos related to

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Nature|April 24, 2010
Substrate-enhanced supercooling in AuSi eutectic dropletsT U Schülli, R Daudin, G Renaud, et al.
Journal of Nanoscience and Nanotechnology|March 10, 2012
A combined In situ grazing incidence small angle X-ray scattering and grazing incidence X-ray diffraction study of the growth of Ge Islands on pit-patterned Si(001) substratesM-I Richard, T U Schülli, G Renaud, et al.
Physical Review Letters|May 21, 2005
Strain induced changes in the magnetic phase diagram of metamagnetic heteroepitaxial EuSe/PbSe(1-x)Tex multilayersR T Lechner, G Springholz, T U Schülli, et al.
Journal of Synchrotron Radiation|April 29, 2011
Three-dimensional diffraction mapping by tuning the X-ray energyT W Cornelius, D Carbone, V L R Jacques, et al.
Optics Express|January 16, 2019
X-ray zoom lens allows for energy scans in X-ray microscopyE Kornemann, T Zhou, O Márkus, et al.
The Review of Scientific Instruments|December 3, 2013
Compact ultrahigh vacuum sample environments for x-ray nanobeam diffraction and imagingP G Evans, G Chahine, R Grifone, et al.
Physical Review Letters|March 14, 2003
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transferT U Schülli, J Stangl, Z Zhong, et al.
Nanotechnology|February 29, 2012
Growth and relaxation processes in Ge nanocrystals on free-standing Si(001) nanopillarsG Kozlowski, P Zaumseil, M A Schubert, et al.
Nanotechnology|August 17, 2012
The role of SiGe buffer in growth and relaxation of Ge on free-standing Si(001) nano-pillarsP Zaumseil, G Kozlowski, M A Schubert, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 19, 2012
Nanoscale distortions of Si quantum wells in Si/SiGe quantum-electronic heterostructuresP G Evans, D E Savage, J R Prance, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Nature|April 24, 2010
Substrate-enhanced supercooling in AuSi eutectic dropletsT U Schülli, R Daudin, G Renaud, et al.
Journal of Nanoscience and Nanotechnology|March 10, 2012
A combined In situ grazing incidence small angle X-ray scattering and grazing incidence X-ray diffraction study of the growth of Ge Islands on pit-patterned Si(001) substratesM-I Richard, T U Schülli, G Renaud, et al.
Physical Review Letters|May 21, 2005
Strain induced changes in the magnetic phase diagram of metamagnetic heteroepitaxial EuSe/PbSe(1-x)Tex multilayersR T Lechner, G Springholz, T U Schülli, et al.
Journal of Synchrotron Radiation|April 29, 2011
Three-dimensional diffraction mapping by tuning the X-ray energyT W Cornelius, D Carbone, V L R Jacques, et al.
Optics Express|January 16, 2019
X-ray zoom lens allows for energy scans in X-ray microscopyE Kornemann, T Zhou, O Márkus, et al.
The Review of Scientific Instruments|December 3, 2013
Compact ultrahigh vacuum sample environments for x-ray nanobeam diffraction and imagingP G Evans, G Chahine, R Grifone, et al.
Physical Review Letters|March 14, 2003
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transferT U Schülli, J Stangl, Z Zhong, et al.
Nanotechnology|February 29, 2012
Growth and relaxation processes in Ge nanocrystals on free-standing Si(001) nanopillarsG Kozlowski, P Zaumseil, M A Schubert, et al.
Nanotechnology|August 17, 2012
The role of SiGe buffer in growth and relaxation of Ge on free-standing Si(001) nano-pillarsP Zaumseil, G Kozlowski, M A Schubert, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 19, 2012
Nanoscale distortions of Si quantum wells in Si/SiGe quantum-electronic heterostructuresP G Evans, D E Savage, J R Prance, et al.
Pageof 2