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Journal of Microscopy
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August 19, 2004
Development of a new analytical electron microscopy technique to quantify the chemistry of planar defects and to measure accurately solute segregation to grain boundaries
T Walther
Journal of Microscopy
|
November 18, 2014
What environmental transmission electron microscopy measures and how this links to diffusivity: thermodynamics versus kinetics
T Walther
Journal of Microscopy
|
December 27, 2025
Determining bismuth content in GaAsBi alloys by energy-dispersive X-ray spectroscopy: A case study with multiple sets of k*-factors for analytical transmission electron microscopy
T Walther
Journal of Microscopy
|
August 17, 2006
Linear least-squares fit evaluation of series of analytical spectra from planar defects: extension and possible implementations in scanning transmission electron microscopy
T Walther
Journal of Microscopy
|
November 19, 2014
Electron microscopy of quantum dots
T Walther
Journal of Microscopy
|
February 28, 2006
A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy
T Walther
Journal of Microscopy
|
August 11, 2015
Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope
T Walther, X Wang
Journal of Microscopy
|
October 4, 2017
Transmission electron microscopy of AlGaAs/GaAs quantum cascade laser structures
T Walther, A B Krysa
Journal of Microscopy
|
August 22, 2018
Self-consistent absorption correction for quantifying very noisy X-ray maps: group III nitride nanowires as an example
X Wang, J Bai, T Walther
Journal of Microscopy
|
January 16, 2016
New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy
M C Parri, Y Qiu, T Walther
Page
of 2
Search research articles
Search
Showing results (1-10 of 12) with videos related to
Sort By:
Page
of 2
Journal of Microscopy
|
August 19, 2004
Development of a new analytical electron microscopy technique to quantify the chemistry of planar defects and to measure accurately solute segregation to grain boundaries
T Walther
Journal of Microscopy
|
November 18, 2014
What environmental transmission electron microscopy measures and how this links to diffusivity: thermodynamics versus kinetics
T Walther
Journal of Microscopy
|
December 27, 2025
Determining bismuth content in GaAsBi alloys by energy-dispersive X-ray spectroscopy: A case study with multiple sets of k*-factors for analytical transmission electron microscopy
T Walther
Journal of Microscopy
|
August 17, 2006
Linear least-squares fit evaluation of series of analytical spectra from planar defects: extension and possible implementations in scanning transmission electron microscopy
T Walther
Journal of Microscopy
|
November 19, 2014
Electron microscopy of quantum dots
T Walther
Journal of Microscopy
|
February 28, 2006
A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy
T Walther
Journal of Microscopy
|
August 11, 2015
Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope
T Walther, X Wang
Journal of Microscopy
|
October 4, 2017
Transmission electron microscopy of AlGaAs/GaAs quantum cascade laser structures
T Walther, A B Krysa
Journal of Microscopy
|
August 22, 2018
Self-consistent absorption correction for quantifying very noisy X-ray maps: group III nitride nanowires as an example
X Wang, J Bai, T Walther
Journal of Microscopy
|
January 16, 2016
New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy
M C Parri, Y Qiu, T Walther
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of 2