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Taek-Seung Yang

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Journal of Nanoscience and Nanotechnology|July 19, 2013

Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integrationJong-Won Sun, Ji Hwan Park, Taek-Seung Yang, et al.

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Search research articles

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Journal of Nanoscience and Nanotechnology|July 19, 2013

Reduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integrationJong-Won Sun, Ji Hwan Park, Taek-Seung Yang, et al.

Pageof 1