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Taishi Takasawa

Showing results (1-10 of 6) with videos related to

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Optics Express|October 17, 2014
An indirect time-of-flight measurement technique with impulse photocurrent response for sub-millimeter range resolved imagingKeita Yasutomi, Takahiro Usui, Sang-Man Han, et al.
Sensors (Basel, Switzerland)|January 21, 2014
RTS noise and dark current white defects reduction using selective averaging based on a multi-aperture systemBo Zhang, Keiichiro Kagawa, Taishi Takasawa, et al.
Sensors (Basel, Switzerland)|March 29, 2018
Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image SensorHaruki Ishida, Keiichiro Kagawa, Takashi Komuro, et al.
Optics Express|February 25, 2016
Single-event transient imaging with an ultra-high-speed temporally compressive multi-aperture CMOS image sensorFuta Mochizuki, Keiichiro Kagawa, Shin-ichiro Okihara, et al.
Sensors (Basel, Switzerland)|April 12, 2022
Resolving Multi-Path Interference in Compressive Time-of-Flight Depth Imaging with a Multi-Tap Macro-Pixel Computational CMOS Image SensorMasaya Horio, Yu Feng, Tomoya Kokado, et al.
Sensors (Basel, Switzerland)|March 10, 2022
A Dual-Mode 303-Megaframes-per-Second Charge-Domain Time-Compressive Computational CMOS Image SensorKeiichiro Kagawa, Masaya Horio, Anh Ngoc Pham, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Optics Express|October 17, 2014
An indirect time-of-flight measurement technique with impulse photocurrent response for sub-millimeter range resolved imagingKeita Yasutomi, Takahiro Usui, Sang-Man Han, et al.
Sensors (Basel, Switzerland)|January 21, 2014
RTS noise and dark current white defects reduction using selective averaging based on a multi-aperture systemBo Zhang, Keiichiro Kagawa, Taishi Takasawa, et al.
Sensors (Basel, Switzerland)|March 29, 2018
Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image SensorHaruki Ishida, Keiichiro Kagawa, Takashi Komuro, et al.
Optics Express|February 25, 2016
Single-event transient imaging with an ultra-high-speed temporally compressive multi-aperture CMOS image sensorFuta Mochizuki, Keiichiro Kagawa, Shin-ichiro Okihara, et al.
Sensors (Basel, Switzerland)|April 12, 2022
Resolving Multi-Path Interference in Compressive Time-of-Flight Depth Imaging with a Multi-Tap Macro-Pixel Computational CMOS Image SensorMasaya Horio, Yu Feng, Tomoya Kokado, et al.
Sensors (Basel, Switzerland)|March 10, 2022
A Dual-Mode 303-Megaframes-per-Second Charge-Domain Time-Compressive Computational CMOS Image SensorKeiichiro Kagawa, Masaya Horio, Anh Ngoc Pham, et al.
Pageof 1