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The Review of Scientific Instruments
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July 19, 2023
Scanning ion conductance microscope with a capacitance-compensated current source amplifier
Kenta Nakazawa, Teruki Tsukamoto, Futoshi Iwata
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of 1
Search research articles
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Showing results (1-10 of 1) with videos related to
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The Review of Scientific Instruments
|
July 19, 2023
Scanning ion conductance microscope with a capacitance-compensated current source amplifier
Kenta Nakazawa, Teruki Tsukamoto, Futoshi Iwata
Page
of 1