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MRS Bulletin|February 27, 2023
Surface topography as a material parameterTevis D B Jacobs, Lars Pastewka,
Nature Nanotechnology|January 29, 2013
Nanoscale wear as a stress-assisted chemical reactionTevis D B Jacobs, Robert W Carpick
Nanoscale Research Letters|October 3, 2022
Atomistic Simulations of the Elastic Compression of Platinum NanoparticlesIngrid M Padilla Espinosa, Tevis D B Jacobs, Ashlie Martini
Journal of Chemical Theory and Computation|June 1, 2021
Evaluation of Force Fields for Molecular Dynamics Simulations of Platinum in Bulk and Nanoparticle FormsIngrid M Padilla Espinosa, Tevis D B Jacobs, Ashlie Martini
Nanoscale|December 21, 2018
Simulations of the effect of an oxide on contact area measurements from conductive atomic force microscopyRimei Chen, Sai Bharadwaj Vishnubhotla, Tevis D B Jacobs, et al.
ACS Applied Materials & Interfaces|July 28, 2018
Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All ScalesAbhijeet Gujrati, Subarna R Khanal, Lars Pastewka, et al.
Science Advances|March 6, 2024
Why soft contacts are stickier when breaking than when making themAntoine Sanner, Nityanshu Kumar, Ali Dhinojwala, et al.
Nanoscale|March 18, 2025
Effect of reversible dislocation-based deformation on nanoparticle strain at failureClaire Zhang, Amit Kumar Prasad, Ting Liu, et al.
The Review of Scientific Instruments|February 1, 2016
Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guideTevis D B Jacobs, Graham E Wabiszewski, Alexander J Goodman, et al.
Nano Letters|July 6, 2022
Origin of Pressure-Dependent Adhesion in Nanoscale ContactsAndrew J Baker, Sai Bharadwaj Vishnubhotla, Rimei Chen, et al.
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