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Thilo Glatzel

Showing results (1-10 of 73) with videos related to

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Science (New York, N.Y.)|June 13, 2009
Applied physics. Novel probes for molecular electronicsErnst Meyer, Thilo Glatzel
Beilstein Journal of Nanotechnology|February 2, 2017
Nanoanalytics for materials scienceThilo Glatzel, Tom Wirtz
Beilstein Journal of Nanotechnology|August 23, 2016
Advanced atomic force microscopy techniques IIIThilo Glatzel, Thomas Schimmel
Microscopy (Oxford, England)|March 11, 2022
Kelvin probe force microscopy for material characterizationThilo Glatzel, Urs Gysin, Ernst Meyer
Beilstein Journal of Nanotechnology|January 1, 2015
Advanced atomic force microscopy techniques IIThilo Glatzel, Ricardo Garcia, Thomas Schimmel
Nanotechnology|June 11, 2009
On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopyLaurent Nony, Franck Bocquet, Christian Loppacher, et al.
Beilstein Journal of Nanotechnology|December 15, 2015
Electrospray deposition of organic molecules on bulk insulator surfacesAntoine Hinaut, Rémy Pawlak, Ernst Meyer, et al.
Nanotechnology|May 21, 2010
Atomic contact potential variations of Si(111)-7 x 7 analyzed by Kelvin probe force microscopyShigeki Kawai, Thilo Glatzel, Hans-Josef Hug, et al.
Angewandte Chemie (International Ed. in English)|June 4, 2025
Chemical Coordination Induced Fullerene Dimers on Hot Pt(111)Zhao Liu, Antoine Hinaut, Thilo Glatzel, et al.
ACS Nano|July 9, 2011
Atomic-scale mechanical properties of orientated C60 molecules revealed by noncontact atomic force microscopyRémy Pawlak, Shigeki Kawai, Sweetlana Fremy, et al.
Pageof 8

Showing results (1-10 of 73) with videos related to

Sort By:
Pageof 8
Science (New York, N.Y.)|June 13, 2009
Applied physics. Novel probes for molecular electronicsErnst Meyer, Thilo Glatzel
Beilstein Journal of Nanotechnology|February 2, 2017
Nanoanalytics for materials scienceThilo Glatzel, Tom Wirtz
Beilstein Journal of Nanotechnology|August 23, 2016
Advanced atomic force microscopy techniques IIIThilo Glatzel, Thomas Schimmel
Microscopy (Oxford, England)|March 11, 2022
Kelvin probe force microscopy for material characterizationThilo Glatzel, Urs Gysin, Ernst Meyer
Beilstein Journal of Nanotechnology|January 1, 2015
Advanced atomic force microscopy techniques IIThilo Glatzel, Ricardo Garcia, Thomas Schimmel
Nanotechnology|June 11, 2009
On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopyLaurent Nony, Franck Bocquet, Christian Loppacher, et al.
Beilstein Journal of Nanotechnology|December 15, 2015
Electrospray deposition of organic molecules on bulk insulator surfacesAntoine Hinaut, Rémy Pawlak, Ernst Meyer, et al.
Nanotechnology|May 21, 2010
Atomic contact potential variations of Si(111)-7 x 7 analyzed by Kelvin probe force microscopyShigeki Kawai, Thilo Glatzel, Hans-Josef Hug, et al.
Angewandte Chemie (International Ed. in English)|June 4, 2025
Chemical Coordination Induced Fullerene Dimers on Hot Pt(111)Zhao Liu, Antoine Hinaut, Thilo Glatzel, et al.
ACS Nano|July 9, 2011
Atomic-scale mechanical properties of orientated C60 molecules revealed by noncontact atomic force microscopyRémy Pawlak, Shigeki Kawai, Sweetlana Fremy, et al.
Pageof 8