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Optics Express|October 12, 2022
Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychographyThomas E J Moxham, Vishal Dhamgaye, David Laundy, et al.Journal of Synchrotron Radiation|November 4, 2020
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron sourceThomas E J Moxham, Aaron Parsons, Tunhe Zhou, et al.ACS Applied Materials & Interfaces|July 31, 2023
Multi-resolution Correlative Ultrastructural and Chemical Analysis of Carious Enamel by Scanning Microscopy and Tomographic ImagingCyril Besnard, Ali Marie, Sisini Sasidharan, et al.Pageof 1