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Thomas Hantschel

Showing results (1-10 of 21) with videos related to

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Nanotechnology|June 3, 2026
Overcoming the Quantification Barrier in Reverse Tip Sample Scanning Spreading Resistance Microscopy for Efficient Nanoscale Carrier ProfilingPieter Lagrain, Nemanja Peric, Lennaert Wouters, et al.
Scientific Reports|September 11, 2020
The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurementsKomal Pandey, Kristof Paredis, Thomas Hantschel, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 2, 2010
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifactsXiaoxing Ke, Sara Bals, Daire Cott, et al.
Micron (Oxford, England : 1993)|August 3, 2021
Crystalline defect analysis in epitaxial Si<sub>0.7</sub>Ge<sub>0.3</sub> layer using site-specific ECCI-STEMHan Han, Libor Strakos, Thomas Hantschel, et al.
Nanotechnology|June 18, 2009
The evolution of pseudo-spherical silicon nanocrystals to tetrahedra, mediated by phosphonic acid surfactantsChristopher A Barrett, Calum Dickinson, S Ahmed, et al.
Ultramicroscopy|August 12, 2009
TEM sample preparation by FIB for carbon nanotube interconnectsXiaoxing Ke, Sara Bals, Ainhoa Romo Negreira, et al.
Small Methods|February 11, 2026
Carrier Mapping in Sub-2nm Node Nanosheet Transistors with Scanning Spreading Resistance MicroscopyAndrea Pondini, Pierre Eyben, Lennaert Wouters, et al.
Micron (Oxford, England : 1993)|September 10, 2025
Applications of electron channeling pattern for the determination of wafer offcut and misorientation anglesHan Han, Libor Strakoš, Clément Porret, et al.
Nanotechnology|March 24, 2024
Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurementsHyeon-Su Kim, Nemanja Peric, Albert Minj, et al.
Scientific Reports|February 16, 2018
Mesoscopic physical removal of material using sliding nano-diamond contactsUmberto Celano, Feng-Chun Hsia, Danielle Vanhaeren, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
Nanotechnology|June 3, 2026
Overcoming the Quantification Barrier in Reverse Tip Sample Scanning Spreading Resistance Microscopy for Efficient Nanoscale Carrier ProfilingPieter Lagrain, Nemanja Peric, Lennaert Wouters, et al.
Scientific Reports|September 11, 2020
The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurementsKomal Pandey, Kristof Paredis, Thomas Hantschel, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 2, 2010
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifactsXiaoxing Ke, Sara Bals, Daire Cott, et al.
Micron (Oxford, England : 1993)|August 3, 2021
Crystalline defect analysis in epitaxial Si<sub>0.7</sub>Ge<sub>0.3</sub> layer using site-specific ECCI-STEMHan Han, Libor Strakos, Thomas Hantschel, et al.
Nanotechnology|June 18, 2009
The evolution of pseudo-spherical silicon nanocrystals to tetrahedra, mediated by phosphonic acid surfactantsChristopher A Barrett, Calum Dickinson, S Ahmed, et al.
Ultramicroscopy|August 12, 2009
TEM sample preparation by FIB for carbon nanotube interconnectsXiaoxing Ke, Sara Bals, Ainhoa Romo Negreira, et al.
Small Methods|February 11, 2026
Carrier Mapping in Sub-2nm Node Nanosheet Transistors with Scanning Spreading Resistance MicroscopyAndrea Pondini, Pierre Eyben, Lennaert Wouters, et al.
Micron (Oxford, England : 1993)|September 10, 2025
Applications of electron channeling pattern for the determination of wafer offcut and misorientation anglesHan Han, Libor Strakoš, Clément Porret, et al.
Nanotechnology|March 24, 2024
Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurementsHyeon-Su Kim, Nemanja Peric, Albert Minj, et al.
Scientific Reports|February 16, 2018
Mesoscopic physical removal of material using sliding nano-diamond contactsUmberto Celano, Feng-Chun Hsia, Danielle Vanhaeren, et al.
Pageof 3