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Forensic Science International|July 30, 2013
Evaluation of C60 secondary ion mass spectrometry for the chemical analysis and imaging of fingerprintsEdward Sisco, Leonard T Demoranville, Greg Gillen
Rapid Communications in Mass Spectrometry : RCM|May 24, 2006
Characterization of high explosive particles using cluster secondary ion mass spectrometryGreg Gillen, Christine Mahoney, Scott Wight, et al.
Analytical Chemistry|May 29, 2004
Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometryChristine M Mahoney, Sonya V Roberson, Greg Gillen
Forensic Science International|July 12, 2005
Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)Christine M Mahoney, Greg Gillen, Albert J Fahey
Analytical Methods : Advancing Methods and Applications|August 15, 2025
The importance of sample preparation method in testing air jet removal efficiencies of trace explosive particles relevant to non-contact samplingRobert Fletcher, Alexander Bulk, Matthew Staymates, et al.
Environmental Science. Processes & Impacts|September 12, 2014
Use of force-sensing array films to improve surface wipe samplingJennifer R Verkouteren, Nicholas W M Ritchie, Greg Gillen
The Analyst|April 18, 2018
Recent advances in ambient mass spectrometry of trace explosivesThomas P Forbes, Edward Sisco
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