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Use of force-sensing array films to improve surface wipe sampling.

Jennifer R Verkouteren1, Nicholas W M Ritchie, Greg Gillen

  • 1National Institute of Standards and Technology (NIST), 100 Bureau Dr., Mailstop 8371, Gaithersburg, MD 20899-8371, USA. Jennifer.verkouteren@nist.gov.

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Summary
This summary is machine-generated.

This study introduces a force-sensing resistor (FSR) array film to measure applied force and area coverage during surface wipe sampling, significantly reducing operator variability and improving collection efficiency.

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Area of Science:

  • Environmental Science
  • Analytical Chemistry
  • Occupational Health

Background:

  • Surface wipe sampling is crucial for environmental monitoring but suffers from high operator variability.
  • Key factors like applied force and area coverage have been difficult to quantify during sampling.
  • Reducing variability is essential for reliable environmental and safety assessments.

Purpose of the Study:

  • To develop and validate a method using a force-sensing resistor (FSR) array film to measure applied force and area coverage during wipe sampling.
  • To assess the impact of force and coverage on sampling efficiency and inter-operator variability.
  • To provide objective feedback for operator training to enhance consistency and accuracy.

Main Methods:

  • A force-sensing resistor (FSR) array film was employed to measure applied force and center-of-force (COF) data for path analysis.
  • Twenty volunteers performed wipe sampling within a defined area, with force and coverage monitored.
  • Fluorescent polymer microspheres were used to quantify collection efficiency under controlled force and coverage conditions.

Main Results:

  • Applied force varied significantly among operators (p < 1.6 × 10⁻⁷), ranging from 3 N to 14 N.
  • Operator training with FSR feedback reduced force variability and improved area coverage to 96%.
  • Collection efficiency increased by approximately 4% per Newton of applied force, ranging from 10% to 50%.

Conclusions:

  • FSR technology enables objective measurement of force and coverage in wipe sampling, crucial for reducing variability.
  • Operator training with FSR feedback significantly improves sampling consistency and efficiency.
  • Optimizing sampling patterns to minimize path length while maximizing coverage is recommended to reduce particle redeposition.