Jove
Visualize
Contact Us

Related Concept Videos

Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

1.2K
Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
1.2K
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

2.5K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
2.5K
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

230
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
230
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

285
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
285
Spectrophotometry: Introduction01:16

Spectrophotometry: Introduction

3.4K
Spectrophotometry is the quantitative measurement of the absorption, reflection, diffraction, or transmission of electromagnetic radiation through a material as a function of the intensity and wavelength of the radiation. A spectrophotometer is a device used to measure the change in the radiation intensity caused by its interaction with the material.
The essential components of a spectrophotometer include a source of electromagnetic radiation, a slot for placing a material to be analyzed, and a...
3.4K
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

577
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
577

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Testing the accuracy of low-beam-energy electron-excited X-ray microanalysis with energy-dispersive spectrometry.

Journal of materials science·2024
Same author

Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk Standards.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2023
Same author

Registering Particle Data Sets Using a Rotation and Translation Invariant Nearest-Neighbor Algorithm.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2023
Same author

Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platform.

MRS advances·2023
Same author

Reproducible Spectrum and Hyperspectrum Data Analysis Using NeXL.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2022
Same journal

Lingual Surface Morphology in Delphinids: Structural Adaptations to Feeding Strategies.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

A Scalable Pathway for Plan-View TEM of 2D Materials and Surface Layers.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Unsupervised Segmentation and Clustering Workflow for Efficient Processing of 4D-STEM and 5D-STEM Data.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Development of an EDS-Based Grain Segmentation Method for MIMAS-MOX Nuclear Fuels.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

The Fabrication of Atom Probe Tomography Specimens From Mineral Nanoplates by Focused Ion Beam Redeposition.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

From Bone to Body: Qualitative Evaluation of Collagenous Tissues Using JFRL Staining in Normal and Pathological Conditions.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
See all related articles
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Aug 30, 2025

Vibrational Spectra of a N719-Chromophore/Titania Interface from Empirical-Potential Molecular-Dynamics Simulation, Solvated by a Room Temperature Ionic Liquid
08:54

Vibrational Spectra of a N719-Chromophore/Titania Interface from Empirical-Potential Molecular-Dynamics Simulation, Solvated by a Room Temperature Ionic Liquid

Published on: January 25, 2020

5.7K

Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited

Dale E Newbury1, Nicholas W M Ritchie1

  • 1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 2, 2022
PubMed
Summary
This summary is machine-generated.

NIST DTSA-II software accurately simulates energy-dispersive spectrometry (EDS) spectra for quantitative elemental analysis. This tool aids in predicting X-ray intensities, optimizing measurements, and developing strategies for trace element detection.

Keywords:
EDS simulationNIST DTSA-II softwareelectron-excited X-ray microanalysiselemental analysisenergy-dispersive spectrometry (EDS)

More Related Videos

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
07:55

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering

Published on: April 17, 2018

12.8K
Quantifying X-Ray Fluorescence Data Using MAPS
14:58

Quantifying X-Ray Fluorescence Data Using MAPS

Published on: February 17, 2018

10.8K

Related Experiment Videos

Last Updated: Aug 30, 2025

Vibrational Spectra of a N719-Chromophore/Titania Interface from Empirical-Potential Molecular-Dynamics Simulation, Solvated by a Room Temperature Ionic Liquid
08:54

Vibrational Spectra of a N719-Chromophore/Titania Interface from Empirical-Potential Molecular-Dynamics Simulation, Solvated by a Room Temperature Ionic Liquid

Published on: January 25, 2020

5.7K
Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
07:55

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering

Published on: April 17, 2018

12.8K
Quantifying X-Ray Fluorescence Data Using MAPS
14:58

Quantifying X-Ray Fluorescence Data Using MAPS

Published on: February 17, 2018

10.8K

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Quantitative elemental analysis using electron-excited X-ray microanalysis with energy-dispersive spectrometry (EDS) relies on software for accurate intensity extraction and physical interaction corrections.
  • The development of robust software is crucial for reliable EDS quantification and measurement optimization.

Purpose of the Study:

  • To introduce NIST DTSA-II as a comprehensive, open-access software platform for EDS quantification, measurement optimization, and spectrum simulation.
  • To validate the accuracy of DTSA-II's spectrum simulation capabilities by comparing predicted and measured X-ray intensities.

Main Methods:

  • Utilizing NIST DTSA-II software for energy-dispersive spectrometry (EDS) spectrum simulation.
  • Predicting EDS spectra for various target compositions based on specified electron dose, spectrometer solid angle, and window parameters.
  • Comparing absolute intensities of simulated spectra with experimentally measured spectra for characteristic X-ray peaks and continuum.

Main Results:

  • Spectrum simulation with DTSA-II shows good agreement with measured spectra, with K-shell and L-shell peaks within ±25% for 1–11 keV.
  • M-shell intensity predictions exceeded measured values by a factor of 1.4–2.2 in the 1–3 keV range.
  • The X-ray continuum (bremsstrahlung) generally agreed within ±10% across the 1–10 keV range.

Conclusions:

  • NIST DTSA-II provides accurate spectrum simulations, crucial for quantitative elemental analysis via EDS.
  • The software is a valuable tool for measurement optimization and developing analytical strategies, particularly for challenging trace detection levels.
  • The validated simulation capabilities enhance the reliability and applicability of EDS in materials analysis.