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Related Concept Videos

Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

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Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
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Atomic Emission Spectroscopy: Lab01:29

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

270
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platform.

Dale E Newbury1, Nicholas W M Ritchie1

  • 1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

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|January 9, 2023
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Summary
This summary is machine-generated.

NIST DTSA-II software simulates X-ray spectra for microanalysis. Its Monte Carlo simulations accurately predict characteristic and continuum X-ray intensities, aiding analytical strategy development.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Electron-excited X-ray microanalysis is crucial for elemental composition determination.
  • Energy Dispersive Spectrometry (EDS) is a common technique, but accurate spectral simulation is challenging.
  • NIST DTSA-II provides a comprehensive platform for EDS analysis.

Purpose of the Study:

  • To evaluate the accuracy of NIST DTSA-II's EDS spectral simulations.
  • To assess the software's utility in developing analytical strategies for microanalysis.

Main Methods:

  • Utilized Monte Carlo electron trajectory simulation for X-ray generation and transport.
  • Included physical processes: characteristic and continuum X-ray generation, self-absorption, EDS window absorption, and energy-to-charge conversion.
  • Simulated spectra on an absolute basis using electron dose and spectrometer parameters.

Main Results:

  • Simulated K-shell and L-shell characteristic X-ray peaks (1-11 keV) showed good agreement (± 25%) with measured spectra.
  • M-shell intensity predictions exceeded measured values by 1.4-2.2 (1-3 keV).
  • X-ray continuum (bremsstrahlung) intensity agreed within ± 10% (1-10 keV) for elements B to Bi.

Conclusions:

  • NIST DTSA-II offers reliable spectral simulations for K and L shells and continuum radiation.
  • The software is a valuable tool for optimizing EDS analytical strategies and assessing trace element detection.
  • Further refinement may be needed for accurate M-shell intensity predictions.