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Nanophotonics (Berlin, Germany)|December 5, 2024
Wafer-scale nanofabrication of sub-5 nm gaps in plasmonic metasurfacesJeetendra Gour, Sebastian Beer, Pallabi Paul, et al.
Nanoscale|October 13, 2022
Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfacesDieter Skroblin, Analía Fernández Herrero, Thomas Siefke, et al.
Optics Express|August 6, 2020
Quasi-bound states in the continuum for deep subwavelength structural information retrieval for DUV nano-optical polarizersThomas Siefke, Carol B Rojas Hurtado, Johannes Dickmann, et al.
Optics Express|February 1, 2024
Structured illumination ptychography and at-wavelength characterization with an EUV diffuser at 13.5 nm wavelengthWilhelm Eschen, Chang Liu, Michael Steinert, et al.
Small (Weinheim an Der Bergstrasse, Germany)|November 25, 2021
Simultaneous Dimensional and Analytical Characterization of Ordered NanostructuresPhilipp Hönicke, Yves Kayser, Konstantin V Nikolaev, et al.
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