Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Thorsten Mehrtens

Showing results (11-20 of 18) with videos related to

Pageof 2
Sort By:
You have reached the last page of results.This site can display upto 18 results.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 11, 2014
Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM imagesMarco Schowalter, Ingo Stoffers, Florian F Krause, et al.
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Nano Letters|August 13, 2016
Nanoscopic Insights into InGaN/GaN Core-Shell Nanorods: Structure, Composition, and LuminescenceMarcus Müller, Peter Veit, Florian F Krause, et al.
Scientific Reports|June 29, 2016
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron DiffractionDaniel Carvalho, Knut Müller-Caspary, Marco Schowalter, et al.
Ultramicroscopy|May 16, 2015
Homogeneity and composition of AlInGaN: A multiprobe nanostructure studyFlorian F Krause, Jan-Philipp Ahl, Darius Tytko, et al.
Ultramicroscopy|August 26, 2011
Composition mapping in InGaN by scanning transmission electron microscopyAndreas Rosenauer, Thorsten Mehrtens, Knut Müller, et al.
Pageof 2

Showing results (11-20 of 18) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 18 results.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 11, 2014
Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM imagesMarco Schowalter, Ingo Stoffers, Florian F Krause, et al.
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Nano Letters|August 13, 2016
Nanoscopic Insights into InGaN/GaN Core-Shell Nanorods: Structure, Composition, and LuminescenceMarcus Müller, Peter Veit, Florian F Krause, et al.
Scientific Reports|June 29, 2016
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron DiffractionDaniel Carvalho, Knut Müller-Caspary, Marco Schowalter, et al.
Ultramicroscopy|May 16, 2015
Homogeneity and composition of AlInGaN: A multiprobe nanostructure studyFlorian F Krause, Jan-Philipp Ahl, Darius Tytko, et al.
Ultramicroscopy|August 26, 2011
Composition mapping in InGaN by scanning transmission electron microscopyAndreas Rosenauer, Thorsten Mehrtens, Knut Müller, et al.
Pageof 2