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Open Research Europe|August 30, 2023
Inhibition of vacuum sublimation artefacts for (Scanning) Transmission Electron Microscopy ((S)TEM) of sulphur samples <i>via</i> encapsulationOskar Ronan, Clive Downing, Valeria NicolosiScientific Reports|May 13, 2025
Rapid eigenpatch utility classifier for image denoisingMichael A J Mitchell, Stefano Sanvito, Lewys JonesNanotechnology|August 9, 2022
Nanoscale mapping of shifts in dark plasmon modes in sub 10 nm aluminum nanoantennasKenan Elibol, Clive Downing, Richard G HobbsMicroscopy (Oxford, England)|May 12, 2026
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEMJonathan J P Peters, Grigore Moldovan, Lewys JonesMicron (Oxford, England : 1993)|March 11, 2017
Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopySigurd Wenner, Lewys Jones, Calin D Marioara, et al.Advanced Structural and Chemical Imaging|June 23, 2018
Maximising the resolving power of the scanning tunneling microscopeLewys Jones, Shuqiu Wang, Xiao Hu, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 31, 2022
Cost and Capability Compromises in STEM Instrumentation for Low-Voltage ImagingFrances Quigley, Patrick McBean, Peter O'Donovan, et al.Ultramicroscopy|March 16, 2023
Correcting for probe wandering by precession path segmentationGregory Nordahl, Lewys Jones, Emil Frang Christiansen, et al.Microscopy (Oxford, England)|May 19, 2025
Auto-thresholding for Unbiased Electron CountingJulie Marie Bekkevold, Jonathan J P Peters, Ryo Ishikawa, et al.Micron (Oxford, England : 1993)|July 16, 2018
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEMAakash Varambhia, Lewys Jones, Andrew London, et al.Pageof 7