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Ultramicroscopy|July 1, 2026
Predictive drift compensation of multi-frame STEM via live scan modificationMatthew Mosse, Jonathan J P Peters, Eoin Moynihan, et al.
Scientific Reports|December 23, 2014
Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopyTimothy J Pennycook, Lewys Jones, Henrik Pettersson, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Beyond Contrast Transfer: Spectral SNR as a Finite-Dose Metric for STEM Phase RetrievalGeorgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet, et al.
ACS Applied Electronic Materials|August 28, 2023
Monolayer Capping Provides Close to Optimal Resistance to Laser Dewetting of Au FilmsChristopher P Murray, Daniyar Mamyraimov, Mugahid Ali, et al.
Science (New York, N.Y.)|August 1, 2024
Event-responsive scanning transmission electron microscopyJonathan J P Peters, Bryan W Reed, Yu Jimbo, et al.
Ultramicroscopy|December 25, 2016
3D elemental mapping with nanometer scale depth resolution via electron optical sectioningTimothy J Pennycook, Hao Yang, Lewys Jones, et al.
ACS Applied Materials & Interfaces|January 19, 2022
Charged Domain Wall and Polar Vortex Topologies in a Room-Temperature Magnetoelectric Multiferroic Thin FilmKalani Moore, Eoghan N O'Connell, Sinéad M Griffin, et al.
Chemical Communications (Cambridge, England)|September 5, 2014
WS₂ 2D nanosheets in 3D nanoflowersArunvinay Prabakaran, Frank Dillon, Jodie Melbourne, et al.
ACS Nano|July 22, 2024
Liquid-Phase Exfoliation of Arsenic Trisulfide (As2S3) Nanosheets and Their Use as Anodes in Potassium-Ion BatteriesHarneet Kaur, Bharathi Konkena, Mark McCrystall, et al.
Micron (Oxford, England : 1993)|September 24, 2021
Prismatic 2.0 - Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM)Luis Rangel DaCosta, Hamish G Brown, Philipp M Pelz, et al.
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