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Tim Grieb

Showing results (21-30 of 36) with videos related to

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Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Nanotechnology|February 24, 2026
Integration of InP membranes with embedded InGaAs quantum wells on silicon-on-insulator by tunnel epitaxyZhao Yan, Tim Grieb, Weiwei Zhang, et al.
Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Physical Review Letters|April 2, 2019
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron MicroscopyKnut Müller-Caspary, Tim Grieb, Jan Müßener, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
ACS Applied Materials & Interfaces|September 30, 2017
Screening Precursor-Solvent Combinations for Li<sub>4</sub>Ti<sub>5</sub>O<sub>12</sub> Energy Storage Material Using Flame Spray PyrolysisFlorian Meierhofer, Haipeng Li, Michael Gockeln, et al.
Ultramicroscopy|October 7, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Robert Ritz, et al.
Scientific Reports|October 22, 2020
Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopyAndreas Beyer, Florian F Krause, Hoel L Robert, et al.
Pageof 4

Showing results (21-30 of 36) with videos related to

Sort By:
Pageof 4
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
Nanotechnology|February 24, 2026
Integration of InP membranes with embedded InGaAs quantum wells on silicon-on-insulator by tunnel epitaxyZhao Yan, Tim Grieb, Weiwei Zhang, et al.
Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Physical Review Letters|April 2, 2019
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron MicroscopyKnut Müller-Caspary, Tim Grieb, Jan Müßener, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
ACS Applied Materials & Interfaces|September 30, 2017
Screening Precursor-Solvent Combinations for Li<sub>4</sub>Ti<sub>5</sub>O<sub>12</sub> Energy Storage Material Using Flame Spray PyrolysisFlorian Meierhofer, Haipeng Li, Michael Gockeln, et al.
Ultramicroscopy|October 7, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Robert Ritz, et al.
Scientific Reports|October 22, 2020
Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopyAndreas Beyer, Florian F Krause, Hoel L Robert, et al.
Pageof 4