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Ultramicroscopy|March 30, 2019
Tip wear and tip breakage in high-speed atomic force microscopesTimo Strahlendorff, Gaoliang Dai, Detlef Bergmann, et al.
Sensors (Basel, Switzerland)|January 11, 2022
True 3D Nanometrology: 3D-Probing with a Cantilever-Based SensorJan Thiesler, Thomas Ahbe, Rainer Tutsch, et al.
Ultramicroscopy|May 16, 2021
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscopeXiao Deng, Gaoliang Dai, Jie Liu, et al.
Applied Optics|December 24, 2011
Random-phase-shift Fizeau interferometerHagen Broistedt, Nicolae Radu Doloca, Sebastian Strube, et al.
Ultramicroscopy|September 1, 2018
Spatial dimensions in atomic force microscopy: Instruments, effects, and measurementsRonald Dixson, Ndubuisi Orji, Ichiko Misumi, et al.
Measurement Science & Technology|October 31, 2024
Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NISTGaoliang Dai, Kai Hahm, Harald Bosse, et al.
The Review of Scientific Instruments|May 2, 2009
A metrological large range atomic force microscope with improved performanceGaoliang Dai, Helmut Wolff, Frank Pohlenz, et al.
Applied Optics|February 23, 2023
In situ, back-focal-plane-based determination of the numerical apertures in optical microscopesJan Krüger, Detlef Bergmann, Rainer Köning, et al.
The Review of Scientific Instruments|October 4, 2018
Metrological large range magnetic force microscopyGaoliang Dai, Xiukun Hu, Sibylle Sievers, et al.
Scientific Reports|January 31, 2018
Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structuresMario Raab, Ija Jusuk, Julia Molle, et al.
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