Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Tomonori Nishimura

Showing results (11-20 of 21) with videos related to

Pageof 3
Sort By:
Physics in Medicine and Biology|February 10, 2018
Performance evaluation of a direct-conversion flat-panel detector system in imaging and quality assurance for a high-dose-rate <sup>192</sup>Ir sourceYoshinori Miyahara, Yuki Hara, Hiroto Nakashima, et al.
ACS Applied Materials & Interfaces|February 7, 2024
Single-Gate MoS<sub>2</sub> Tunnel FET with a Thickness-Modulated HomojunctionTomohiro Fukui, Tomonori Nishimura, Yasumitsu Miyata, et al.
Journal of Applied Clinical Medical Physics|February 14, 2015
Usefulness of direct-conversion flat-panel detector system as a quality assurance tool for high-dose-rate 192Ir sourceYoshinori Miyahara, Hajime Kitagaki, Tomonori Nishimura, et al.
ACS Applied Materials & Interfaces|May 24, 2023
p-Type Conversion of WS<sub>2</sub> and WSe<sub>2</sub> by Position-Selective Oxidation Doping and Its Application in Top Gate TransistorsRyoichi Kato, Haruki Uchiyama, Tomonori Nishimura, et al.
Small Methods|October 21, 2025
Quantitative ToF-SIMS Assessment of In-Plane and Out-of-Plane Nb Doping Uniformity in CVT-Grown MoS<sub>2</sub> CrystalsItsuki Tanaka, Mian Wei, Tomonori Nishimura, et al.
Advanced Materials (Deerfield Beach, Fla.)|May 6, 2023
Shift-Current Photovoltaics Based on a Non-Centrosymmetric Phase in In-Plane Ferroelectric SnSYih-Ren Chang, Ryo Nanae, Satsuki Kitamura, et al.
Nature Communications|May 17, 2020
Purely in-plane ferroelectricity in monolayer SnS at room temperatureNaoki Higashitarumizu, Hayami Kawamoto, Chien-Ju Lee, et al.
ACS Omega|September 29, 2025
Structural and Electric Characterization of Sputtered Pt/WSe<sub>2</sub> Contacts toward High-Performance 2D p‑FETsRyuichi Nakajima, Tomonori Nishimura, Kaito Kanahashi, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 6, 2026
MOCVD-Grown MoS<sub>2</sub> Wafers as a Transfer-Free Platform for Top-Gate Devices via Dry Interface EngineeringShuhong Li, Juiteng Chang, Keisuke Atsumi, et al.
ACS Nano|March 3, 2025
Dimensionality-Induced Transition from Degenerate to Nondegenerate States in Nb-Doped WSe<sub>2</sub>Kaito Kanahashi, Itsuki Tanaka, Tomonori Nishimura, et al.
Pageof 3

Showing results (11-20 of 21) with videos related to

Sort By:
Pageof 3
Physics in Medicine and Biology|February 10, 2018
Performance evaluation of a direct-conversion flat-panel detector system in imaging and quality assurance for a high-dose-rate <sup>192</sup>Ir sourceYoshinori Miyahara, Yuki Hara, Hiroto Nakashima, et al.
ACS Applied Materials & Interfaces|February 7, 2024
Single-Gate MoS<sub>2</sub> Tunnel FET with a Thickness-Modulated HomojunctionTomohiro Fukui, Tomonori Nishimura, Yasumitsu Miyata, et al.
Journal of Applied Clinical Medical Physics|February 14, 2015
Usefulness of direct-conversion flat-panel detector system as a quality assurance tool for high-dose-rate 192Ir sourceYoshinori Miyahara, Hajime Kitagaki, Tomonori Nishimura, et al.
ACS Applied Materials & Interfaces|May 24, 2023
p-Type Conversion of WS<sub>2</sub> and WSe<sub>2</sub> by Position-Selective Oxidation Doping and Its Application in Top Gate TransistorsRyoichi Kato, Haruki Uchiyama, Tomonori Nishimura, et al.
Small Methods|October 21, 2025
Quantitative ToF-SIMS Assessment of In-Plane and Out-of-Plane Nb Doping Uniformity in CVT-Grown MoS<sub>2</sub> CrystalsItsuki Tanaka, Mian Wei, Tomonori Nishimura, et al.
Advanced Materials (Deerfield Beach, Fla.)|May 6, 2023
Shift-Current Photovoltaics Based on a Non-Centrosymmetric Phase in In-Plane Ferroelectric SnSYih-Ren Chang, Ryo Nanae, Satsuki Kitamura, et al.
Nature Communications|May 17, 2020
Purely in-plane ferroelectricity in monolayer SnS at room temperatureNaoki Higashitarumizu, Hayami Kawamoto, Chien-Ju Lee, et al.
ACS Omega|September 29, 2025
Structural and Electric Characterization of Sputtered Pt/WSe<sub>2</sub> Contacts toward High-Performance 2D p‑FETsRyuichi Nakajima, Tomonori Nishimura, Kaito Kanahashi, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 6, 2026
MOCVD-Grown MoS<sub>2</sub> Wafers as a Transfer-Free Platform for Top-Gate Devices via Dry Interface EngineeringShuhong Li, Juiteng Chang, Keisuke Atsumi, et al.
ACS Nano|March 3, 2025
Dimensionality-Induced Transition from Degenerate to Nondegenerate States in Nb-Doped WSe<sub>2</sub>Kaito Kanahashi, Itsuki Tanaka, Tomonori Nishimura, et al.
Pageof 3