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Toshie Yaguchi

Showing results (1-10 of 21) with videos related to

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Microscopy (Oxford, England)|April 8, 2024
Editorial: In-situ microscopyToshie Yaguchi, Ayako Hashimoto, Junko Matsuda
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 31, 2017
Development and Application of a Sample Holder for In Situ Gaseous TEM Studies of Membrane Electrode Assemblies for Polymer Electrolyte Fuel CellsTakeo Kamino, Toshie Yaguchi, Takahiro Shimizu
Microscopy (Oxford, England)|February 22, 2013
High-resolution environmental transmission electron microscopy: modeling and experimental verificationMakoto Suzuki, Toshie Yaguchi, Xiao Feng Zhang
Journal of Electron Microscopy|February 24, 2006
Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperaturesTakeo Kamino, Toshie Yaguchi, Takahiro Sato, et al.
Ultramicroscopy|August 22, 2008
Observation of three-dimensional elemental distributions of a Si device using a 360 degrees -tilt FIB and the cold field-emission STEM systemToshie Yaguchi, Mitsuru Konno, Takeo Kamino, et al.
Journal of Electron Microscopy|October 1, 2005
In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particlesTakeo Kamino, Toshie Yaguchi, Mitsuru Konno, et al.
Journal of Electron Microscopy|December 8, 2004
A method for multidirectional TEM observation of a specific site at atomic resolutionTakeo Kamino, Toshie Yaguchi, Mitsuru Konno, et al.
Journal of Electron Microscopy|December 8, 2004
Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interactionTohru Ishitani, Kaoru Umemura, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy|December 8, 2004
Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cellTakeo Kamino, Toshie Yaguchi, Tsuyoshi Ohnishi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a SteelToshie Yaguchi, Hiroaki Matsumoto, Takeo Kamino, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
Microscopy (Oxford, England)|April 8, 2024
Editorial: In-situ microscopyToshie Yaguchi, Ayako Hashimoto, Junko Matsuda
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 31, 2017
Development and Application of a Sample Holder for In Situ Gaseous TEM Studies of Membrane Electrode Assemblies for Polymer Electrolyte Fuel CellsTakeo Kamino, Toshie Yaguchi, Takahiro Shimizu
Microscopy (Oxford, England)|February 22, 2013
High-resolution environmental transmission electron microscopy: modeling and experimental verificationMakoto Suzuki, Toshie Yaguchi, Xiao Feng Zhang
Journal of Electron Microscopy|February 24, 2006
Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperaturesTakeo Kamino, Toshie Yaguchi, Takahiro Sato, et al.
Ultramicroscopy|August 22, 2008
Observation of three-dimensional elemental distributions of a Si device using a 360 degrees -tilt FIB and the cold field-emission STEM systemToshie Yaguchi, Mitsuru Konno, Takeo Kamino, et al.
Journal of Electron Microscopy|October 1, 2005
In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particlesTakeo Kamino, Toshie Yaguchi, Mitsuru Konno, et al.
Journal of Electron Microscopy|December 8, 2004
A method for multidirectional TEM observation of a specific site at atomic resolutionTakeo Kamino, Toshie Yaguchi, Mitsuru Konno, et al.
Journal of Electron Microscopy|December 8, 2004
Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interactionTohru Ishitani, Kaoru Umemura, Tsuyoshi Ohnishi, et al.
Journal of Electron Microscopy|December 8, 2004
Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cellTakeo Kamino, Toshie Yaguchi, Tsuyoshi Ohnishi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a SteelToshie Yaguchi, Hiroaki Matsumoto, Takeo Kamino, et al.
Pageof 3