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Optics Express|March 14, 2013
Tilt-ellipsometry of object surface by specular reflection for three-dimensional shape measurementToshihide TsuruOptics Express|June 26, 2008
Multi-bits coding by multi-directional valley pits permitting stamper mass-production and remote direction readout by polarization reflectionToshihide Tsuru, Masaki YamamotoApplied Optics|August 7, 2007
Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elementsTakashi Sato, Takeshi Araki, Yoshihiro Sasaki, et al.Optics Express|April 15, 2010
High throughput and wide field of view EUV microscope for blur-free one-shot imaging of living organismsTakeo Ejima, Fumihiko Ishida, Hiromichi Murata, et al.Pageof 1