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Optics Express|February 25, 2022
Fourier ptychographic dark field x-ray microscopyMads Carlsen, Trygve M Ræder, Can Yildirim, et al.
The Review of Scientific Instruments|July 21, 2026
Single-pulse x-ray topography of ambient and shock-compressed diamondCara E Vennari, Richard Briggs, Carol A Davis, et al.
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