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Ullrich Pietsch

Showing results (41-50 of 52) with videos related to

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Journal of Synchrotron Radiation|September 2, 2017
Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffractionArman Davtyan, Sebastian Lehmann, Dominik Kriegner, et al.
Nanoscale|January 11, 2023
Exploiting flux shadowing for strain and bending engineering in core-shell nanowiresMahmoud Al Humaidi, Julian Jakob, Ali Al Hassan, et al.
Nano Letters|June 1, 2019
Impact of the Shadowing Effect on the Crystal Structure of Patterned Self-Catalyzed GaAs NanowiresPhilipp Schroth, Mahmoud Al Humaidi, Ludwig Feigl, et al.
Journal of Synchrotron Radiation|September 3, 2020
Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experimentsAli Al Hassan, Jonas Lähnemann, Arman Davtyan, et al.
Nanoscale Research Letters|June 1, 2019
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical MeasurementsEduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, et al.
Journal of Synchrotron Radiation|December 25, 2014
Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffractionMartin Köhl, Philipp Schroth, Andrey A Minkevich, et al.
Nanotechnology|September 24, 2021
<i>In situ</i>x-ray analysis of misfit strain and curvature of bent polytypic GaAs-In<i></i>Ga<sub>1-</sub>As core-shell nanowiresMahmoud Al-Humaidi, Ludwig Feigl, Julian Jakob, et al.
RSC Advances|April 28, 2022
Sub-nanograin metal based high efficiency multilayer reflective optics for high energiesArindam Majhi, Maheswar Nayak, Paresh Chandra Pradhan, et al.
Journal of Applied Crystallography|October 29, 2020
X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowiresArman Davtyan, Dominik Kriegner, Václav Holý, et al.
Journal of Applied Crystallography|June 29, 2017
Threefold rotational symmetry in hexagonally shaped core-shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imagingArman Davtyan, Thilo Krause, Dominik Kriegner, et al.
Pageof 6

Showing results (41-50 of 52) with videos related to

Sort By:
Pageof 6
Journal of Synchrotron Radiation|September 2, 2017
Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffractionArman Davtyan, Sebastian Lehmann, Dominik Kriegner, et al.
Nanoscale|January 11, 2023
Exploiting flux shadowing for strain and bending engineering in core-shell nanowiresMahmoud Al Humaidi, Julian Jakob, Ali Al Hassan, et al.
Nano Letters|June 1, 2019
Impact of the Shadowing Effect on the Crystal Structure of Patterned Self-Catalyzed GaAs NanowiresPhilipp Schroth, Mahmoud Al Humaidi, Ludwig Feigl, et al.
Journal of Synchrotron Radiation|September 3, 2020
Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experimentsAli Al Hassan, Jonas Lähnemann, Arman Davtyan, et al.
Nanoscale Research Letters|June 1, 2019
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical MeasurementsEduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, et al.
Journal of Synchrotron Radiation|December 25, 2014
Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffractionMartin Köhl, Philipp Schroth, Andrey A Minkevich, et al.
Nanotechnology|September 24, 2021
<i>In situ</i>x-ray analysis of misfit strain and curvature of bent polytypic GaAs-In<i></i>Ga<sub>1-</sub>As core-shell nanowiresMahmoud Al-Humaidi, Ludwig Feigl, Julian Jakob, et al.
RSC Advances|April 28, 2022
Sub-nanograin metal based high efficiency multilayer reflective optics for high energiesArindam Majhi, Maheswar Nayak, Paresh Chandra Pradhan, et al.
Journal of Applied Crystallography|October 29, 2020
X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowiresArman Davtyan, Dominik Kriegner, Václav Holý, et al.
Journal of Applied Crystallography|June 29, 2017
Threefold rotational symmetry in hexagonally shaped core-shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imagingArman Davtyan, Thilo Krause, Dominik Kriegner, et al.
Pageof 6