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Ulrich Vogt

Showing results (21-30 of 35) with videos related to

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Scientific Reports|March 19, 2025
Multi-beam multi-slice X-ray ptychographyMattias Åstrand, Ulrich Vogt, Runqing Yang, et al.
Optics Express|March 4, 2020
Ptychographic characterization of a coherent nanofocused X-ray beamAlexander Björling, Sebastian Kalbfleisch, Maik Kahnt, et al.
Micromachines|March 19, 2020
Metal-Assisted Chemical Etching and Electroless Deposition for Fabrication of Hard X-ray Pd/Si Zone PlatesRabia Akan, Thomas Frisk, Fabian Lundberg, et al.
The Review of Scientific Instruments|June 3, 2017
Interferometric characterization of rotation stages for X-ray nanotomographyTomaš Stankevič, Christer Engblom, Florent Langlois, et al.
Journal of Synchrotron Radiation|September 2, 2014
Ronchi test for characterization of X-ray nanofocusing optics and beamlinesFredrik Uhlén, Jussi Rahomäki, Daniel Nilsson, et al.
Optics Letters|September 1, 2005
Single-optical-element soft-x-ray interferometry with a laser-plasma x-ray sourceUlrich Vogt, Magnus Lindblom, Per A C Jansson, et al.
Optics Express|August 9, 2017
Moiré method for nanometer instability investigation of scanning hard x-ray microscopesUlrich Vogt, Daniel Köhler, Jannis Dickmann, et al.
Sensors (Basel, Switzerland)|July 2, 2021
Calibration Method for Particulate Matter Low-Cost Sensors Used in Ambient Air Quality Monitoring and ResearchJanani Venkatraman Jagatha, André Klausnitzer, Miriam Chacón-Mateos, et al.
Optics Express|June 14, 2025
Stereo hard X-ray ptychographySina Röper, Sarah-Alexandra Hussak, Karolina Stachnik, et al.
Scientific Reports|September 1, 2025
X-ray near-field multi-slice ptychography for in-situ imagingSina Röper, Karolina Stachnik, Jonas Voss, et al.
Pageof 4

Showing results (21-30 of 35) with videos related to

Sort By:
Pageof 4
Scientific Reports|March 19, 2025
Multi-beam multi-slice X-ray ptychographyMattias Åstrand, Ulrich Vogt, Runqing Yang, et al.
Optics Express|March 4, 2020
Ptychographic characterization of a coherent nanofocused X-ray beamAlexander Björling, Sebastian Kalbfleisch, Maik Kahnt, et al.
Micromachines|March 19, 2020
Metal-Assisted Chemical Etching and Electroless Deposition for Fabrication of Hard X-ray Pd/Si Zone PlatesRabia Akan, Thomas Frisk, Fabian Lundberg, et al.
The Review of Scientific Instruments|June 3, 2017
Interferometric characterization of rotation stages for X-ray nanotomographyTomaš Stankevič, Christer Engblom, Florent Langlois, et al.
Journal of Synchrotron Radiation|September 2, 2014
Ronchi test for characterization of X-ray nanofocusing optics and beamlinesFredrik Uhlén, Jussi Rahomäki, Daniel Nilsson, et al.
Optics Letters|September 1, 2005
Single-optical-element soft-x-ray interferometry with a laser-plasma x-ray sourceUlrich Vogt, Magnus Lindblom, Per A C Jansson, et al.
Optics Express|August 9, 2017
Moiré method for nanometer instability investigation of scanning hard x-ray microscopesUlrich Vogt, Daniel Köhler, Jannis Dickmann, et al.
Sensors (Basel, Switzerland)|July 2, 2021
Calibration Method for Particulate Matter Low-Cost Sensors Used in Ambient Air Quality Monitoring and ResearchJanani Venkatraman Jagatha, André Klausnitzer, Miriam Chacón-Mateos, et al.
Optics Express|June 14, 2025
Stereo hard X-ray ptychographySina Röper, Sarah-Alexandra Hussak, Karolina Stachnik, et al.
Scientific Reports|September 1, 2025
X-ray near-field multi-slice ptychography for in-situ imagingSina Röper, Karolina Stachnik, Jonas Voss, et al.
Pageof 4