Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ute Kaiser

Showing results (1-10 of 228) with videos related to

Pageof 23
Sort By:
National Science Review|May 11, 2026
Atomic imaging of air- and electron-beam-sensitive materials by inert-gas-protected cryogenic aberration-corrected TEMUte Kaiser
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2003
Enhanced compositional contrast in imaging of nanoprecipitates buried in a defective crystal using a conventional TEMUte Kaiser, Andrey Chuvilin
Journal of Electron Microscopy|December 8, 2004
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractogramsJohannes Biskupek, Ute Kaiser
Ultramicroscopy|June 5, 2009
Structural imaging of beta-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopyZaoli Zhang, Ute Kaiser
Ultramicroscopy|June 9, 2014
Foreword to the special issue low-voltage electron microscopyUte Kaiser, Michael Stöger-Pollach
Nanotechnology|September 18, 2020
In-situ formation and evolution of atomic defects in monolayer WSe<sub>2</sub> under electron irradiationRobert Leiter, Yueliang Li, Ute Kaiser
Journal of Electron Microscopy|August 31, 2004
The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determinationAndrey Chuvilin, Thomas Kups, Ute Kaiser
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 22, 2018
Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron MicroscopeFelix Börrnert, Julian Renner, Ute Kaiser
Journal of Electron Microscopy|December 24, 2005
Matrix-dependent structure of GeSi nanocrystals in SiCJohannes Biskupek, Ute Kaiser, Konrad Gärtner
Micron (Oxford, England : 1993)|November 27, 2025
Application of position-averaged convergent beam electron diffraction to determine the thickness of ultra-thin materialsJohannes Biskupek, Philipp Eltgen, Ute Kaiser
Pageof 23

Showing results (1-10 of 228) with videos related to

Sort By:
Pageof 23
National Science Review|May 11, 2026
Atomic imaging of air- and electron-beam-sensitive materials by inert-gas-protected cryogenic aberration-corrected TEMUte Kaiser
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2003
Enhanced compositional contrast in imaging of nanoprecipitates buried in a defective crystal using a conventional TEMUte Kaiser, Andrey Chuvilin
Journal of Electron Microscopy|December 8, 2004
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractogramsJohannes Biskupek, Ute Kaiser
Ultramicroscopy|June 5, 2009
Structural imaging of beta-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopyZaoli Zhang, Ute Kaiser
Ultramicroscopy|June 9, 2014
Foreword to the special issue low-voltage electron microscopyUte Kaiser, Michael Stöger-Pollach
Nanotechnology|September 18, 2020
In-situ formation and evolution of atomic defects in monolayer WSe<sub>2</sub> under electron irradiationRobert Leiter, Yueliang Li, Ute Kaiser
Journal of Electron Microscopy|August 31, 2004
The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determinationAndrey Chuvilin, Thomas Kups, Ute Kaiser
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 22, 2018
Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron MicroscopeFelix Börrnert, Julian Renner, Ute Kaiser
Journal of Electron Microscopy|December 24, 2005
Matrix-dependent structure of GeSi nanocrystals in SiCJohannes Biskupek, Ute Kaiser, Konrad Gärtner
Micron (Oxford, England : 1993)|November 27, 2025
Application of position-averaged convergent beam electron diffraction to determine the thickness of ultra-thin materialsJohannes Biskupek, Philipp Eltgen, Ute Kaiser
Pageof 23