Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ute Kaiser

Showing results (11-20 of 228) with videos related to

Pageof 23
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2012
Improved focused ion beam target preparation of (S)TEM specimen--a method for obtaining ultrathin lamellaeLorenz Lechner, Johannes Biskupek, Ute Kaiser
Journal of Electron Microscopy|May 28, 2008
Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopyJohannes Biskupek, Ute Kaiser, Fritz Falk
Nanoscale|May 26, 2026
Divergent phase evolution in mixed oxide W<sub>0.5</sub>Mo<sub>0.5</sub>O<sub>3</sub> under electron beam irradiation and thermal annealingNaveen Goyal, Johannes Biskupek, Ute Kaiser
Nature|December 25, 2015
Algara-Siller et al. replyG Algara-Siller, O Lehtinen, Ute Kaiser
Journal of Electron Microscopy|April 14, 2012
Local symmetry breaking of a thin crystal structure of β-Si3N4 as revealed by spherical aberration corrected high-resolution transmission electron microscopy imagesHwang Su Kim, Zaoli Zhang, Ute Kaiser
Ultramicroscopy|June 24, 2010
Optimization of STEM tomography acquisition--a comparison of convergent beam and parallel beam STEM tomographyJohannes Biskupek, Jens Leschner, Paul Walther, et al.
Ultramicroscopy|September 4, 2015
Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEMKaname Yoshida, Johannes Biskupek, Hiroki Kurata, et al.
Nano Letters|July 1, 2024
Defect Density and Atomic Defect Recognition in the Middle Layer of a Trilayer MoS<sub>2</sub> StackMoritz Quincke, Manuel Mundszinger, Johannes Biskupek, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2022
Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick SamplesZhongbo Li, Johannes Biskupek, Ute Kaiser, et al.
Nanotechnology|October 26, 2020
Polymer-assisted TEM specimen preparation method for oxidation-sensitive 2D materialsJanis Köster, Baokun Liang, Alexander Storm, et al.
Pageof 23

Showing results (11-20 of 228) with videos related to

Sort By:
Pageof 23
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2012
Improved focused ion beam target preparation of (S)TEM specimen--a method for obtaining ultrathin lamellaeLorenz Lechner, Johannes Biskupek, Ute Kaiser
Journal of Electron Microscopy|May 28, 2008
Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopyJohannes Biskupek, Ute Kaiser, Fritz Falk
Nanoscale|May 26, 2026
Divergent phase evolution in mixed oxide W<sub>0.5</sub>Mo<sub>0.5</sub>O<sub>3</sub> under electron beam irradiation and thermal annealingNaveen Goyal, Johannes Biskupek, Ute Kaiser
Nature|December 25, 2015
Algara-Siller et al. replyG Algara-Siller, O Lehtinen, Ute Kaiser
Journal of Electron Microscopy|April 14, 2012
Local symmetry breaking of a thin crystal structure of β-Si3N4 as revealed by spherical aberration corrected high-resolution transmission electron microscopy imagesHwang Su Kim, Zaoli Zhang, Ute Kaiser
Ultramicroscopy|June 24, 2010
Optimization of STEM tomography acquisition--a comparison of convergent beam and parallel beam STEM tomographyJohannes Biskupek, Jens Leschner, Paul Walther, et al.
Ultramicroscopy|September 4, 2015
Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEMKaname Yoshida, Johannes Biskupek, Hiroki Kurata, et al.
Nano Letters|July 1, 2024
Defect Density and Atomic Defect Recognition in the Middle Layer of a Trilayer MoS<sub>2</sub> StackMoritz Quincke, Manuel Mundszinger, Johannes Biskupek, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2022
Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick SamplesZhongbo Li, Johannes Biskupek, Ute Kaiser, et al.
Nanotechnology|October 26, 2020
Polymer-assisted TEM specimen preparation method for oxidation-sensitive 2D materialsJanis Köster, Baokun Liang, Alexander Storm, et al.
Pageof 23