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Uwe Schroeder

Showing results (11-20 of 30) with videos related to

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ACS Applied Materials & Interfaces|August 15, 2018
Genuinely Ferroelectric Sub-1-Volt-Switchable Nanodomains in Hf <sub>x</sub>Zr<sub>(1- x)</sub>O<sub>2</sub> Ultrathin CapacitorsIgor Stolichnov, Matteo Cavalieri, Enrico Colla, et al.
ACS Applied Materials & Interfaces|June 14, 2024
Influence of Biaxial Strain and Interfacial Layer Growth on Ferroelectric Wake-Up and Phase Transition Fields in ZrO<sub>2</sub>Bohan Xu, Richard Ganser, Kristina M Holsgrove, et al.
Small (Weinheim an Der Bergstrasse, Germany)|February 4, 2025
Interaction Between Strain and Phase Formation in Hf<sub>x</sub>Zr<sub>1-x</sub>O<sub>2</sub> Thin FilmsFlorian Wunderwald, Bohan Xu, Alfred Kersch, et al.
Nature Communications|December 16, 2021
Piezoelectricity in hafniaSangita Dutta, Pratyush Buragohain, Sebastjan Glinsek, et al.
ACS Applied Materials & Interfaces|January 11, 2017
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect TransistorsHalid Mulaosmanovic, Johannes Ocker, Stefan Müller, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 10, 2022
Quantification of the Electromechanical Measurements by Piezoresponse Force MicroscopyPratyush Buragohain, Haidong Lu, Claudia Richter, et al.
Nature|January 16, 2019
Unveiling the double-well energy landscape in a ferroelectric layerMichael Hoffmann, Franz P G Fengler, Melanie Herzig, et al.
Nanotechnology|December 20, 2022
Reduced fatigue and leakage of ferroelectric TiN/Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>/TiN capacitors by thin alumina interlayers at the top or bottom interfaceH Alex Hsain, Younghwan Lee, Suzanne Lancaster, et al.
ACS Applied Materials & Interfaces|December 29, 2017
Improved Ferroelectric Switching Endurance of La-Doped Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Thin FilmsAnna G Chernikova, Maxim G Kozodaev, Dmitry V Negrov, et al.
ACS Applied Materials & Interfaces|September 7, 2022
Role of Oxygen Source on Buried Interfaces in Atomic-Layer-Deposited Ferroelectric Hafnia-Zirconia Thin FilmsHanan Alexandra Hsain, Younghwan Lee, Suzanne Lancaster, et al.
Pageof 3

Showing results (11-20 of 30) with videos related to

Sort By:
Pageof 3
ACS Applied Materials & Interfaces|August 15, 2018
Genuinely Ferroelectric Sub-1-Volt-Switchable Nanodomains in Hf <sub>x</sub>Zr<sub>(1- x)</sub>O<sub>2</sub> Ultrathin CapacitorsIgor Stolichnov, Matteo Cavalieri, Enrico Colla, et al.
ACS Applied Materials & Interfaces|June 14, 2024
Influence of Biaxial Strain and Interfacial Layer Growth on Ferroelectric Wake-Up and Phase Transition Fields in ZrO<sub>2</sub>Bohan Xu, Richard Ganser, Kristina M Holsgrove, et al.
Small (Weinheim an Der Bergstrasse, Germany)|February 4, 2025
Interaction Between Strain and Phase Formation in Hf<sub>x</sub>Zr<sub>1-x</sub>O<sub>2</sub> Thin FilmsFlorian Wunderwald, Bohan Xu, Alfred Kersch, et al.
Nature Communications|December 16, 2021
Piezoelectricity in hafniaSangita Dutta, Pratyush Buragohain, Sebastjan Glinsek, et al.
ACS Applied Materials & Interfaces|January 11, 2017
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect TransistorsHalid Mulaosmanovic, Johannes Ocker, Stefan Müller, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 10, 2022
Quantification of the Electromechanical Measurements by Piezoresponse Force MicroscopyPratyush Buragohain, Haidong Lu, Claudia Richter, et al.
Nature|January 16, 2019
Unveiling the double-well energy landscape in a ferroelectric layerMichael Hoffmann, Franz P G Fengler, Melanie Herzig, et al.
Nanotechnology|December 20, 2022
Reduced fatigue and leakage of ferroelectric TiN/Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>/TiN capacitors by thin alumina interlayers at the top or bottom interfaceH Alex Hsain, Younghwan Lee, Suzanne Lancaster, et al.
ACS Applied Materials & Interfaces|December 29, 2017
Improved Ferroelectric Switching Endurance of La-Doped Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Thin FilmsAnna G Chernikova, Maxim G Kozodaev, Dmitry V Negrov, et al.
ACS Applied Materials & Interfaces|September 7, 2022
Role of Oxygen Source on Buried Interfaces in Atomic-Layer-Deposited Ferroelectric Hafnia-Zirconia Thin FilmsHanan Alexandra Hsain, Younghwan Lee, Suzanne Lancaster, et al.
Pageof 3