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V G M Sivel

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Journal of Microscopy|April 29, 2005
Crystallographic analysis of thin specimensV G M Sivel, F D Tichelaar, H Mohdadi, et al.
Journal of Microscopy|May 26, 2004
Application of the dual-beam FIB/SEM to metals researchV G M Sivel, J Van den Brand, W R Wang, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|April 29, 2005
Crystallographic analysis of thin specimensV G M Sivel, F D Tichelaar, H Mohdadi, et al.
Journal of Microscopy|May 26, 2004
Application of the dual-beam FIB/SEM to metals researchV G M Sivel, J Van den Brand, W R Wang, et al.
Pageof 1