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V N Tondare

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Proceedings of Spie--The International Society for Optical Engineering|July 25, 2017

Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetryJ S Villarrubia, V N Tondare, A E Vladár

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Search research articles

Showing results (1-10 of 1) with videos related to

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Proceedings of Spie--The International Society for Optical Engineering|July 25, 2017

Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetryJ S Villarrubia, V N Tondare, A E Vladár

Pageof 1