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Journal of Synchrotron Radiation|April 23, 2025
Ultimate brightness of a medium-energy synchrotron light source at operational beam intensityVictor Smaluk, Timur Shaftan, Dean Hidas
Nanomaterials (Basel, Switzerland)|May 10, 2024
Optimize Electron Beam Energy toward In Situ Imaging of Thick Frozen Bio-Samples with Nanometer Resolution Using MeV-STEMXi Yang, Liguo Wang, Victor Smaluk, et al.
Scientific Reports|October 1, 2020
Toward monochromated sub-nanometer UEM and femtosecond UEDXi Yang, Weishi Wan, Lijun Wu, et al.
Scientific Reports|November 22, 2019
A novel nondestructive diagnostic method for mega-electron-volt ultrafast electron diffractionXi Yang, Junjie Li, Mikhail Fedurin, et al.
Nanomaterials (Basel, Switzerland)|November 26, 2024
Simulation Study of High-Precision Characterization of MeV Electron Interactions for Advanced Nano-Imaging of Thick Biological Samples and MicrochipsXi Yang, Liguo Wang, Victor Smaluk, et al.
Scientific Reports|March 11, 2022
Toward fully automated UED operation using two-stage machine learning modelZhe Zhang, Xi Yang, Xiaobiao Huang, et al.
Ultramicroscopy|October 25, 2025
Experimental study of energy-dependent angular broadening of MeV electron beams for high-resolution imaging in thick samplesXi Yang, Paul Denham, Atharva Kulkarni, et al.
Scientific Reports|July 7, 2021
Accurate prediction of mega-electron-volt electron beam properties from UED using machine learningZhe Zhang, Xi Yang, Xiaobiao Huang, et al.
Scientific Reports|March 28, 2019
A compact tunable quadrupole lens for brighter and sharper ultra-fast electron diffraction imagingXi Yang, Lihua Yu, Victor Smaluk, et al.
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