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Optics Express
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August 19, 2009
White-light scanning interferometer for absolute nano-scale gap thickness measurement
Zhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, et al.
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Search research articles
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Showing results (1-10 of 1) with videos related to
Sort By:
Page
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Optics Express
|
August 19, 2009
White-light scanning interferometer for absolute nano-scale gap thickness measurement
Zhiguang Xu, Vijay Shilpiekandula, Kamal Youcef-toumi, et al.
Page
of 1