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Vipin N Tondare

Showing results (1-10 of 4) with videos related to

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Journal of Research of the National Institute of Standards and Technology|April 25, 2022
A Concept for Three-Dimensional Particle Metrology Based on Scanning Electron Microscopy and Structure-from-Motion PhotogrammetryVipin N Tondare
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2017
Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) StereophotogrammetryVipin N Tondare, John S Villarrubia, András E Vladár
CIRP Annals ... Manufacturing Technology|November 14, 2024
Uncertainty of particle size measurements using dynamic image analysis<sup>☆</sup>Justin G Whiting, Vipin N Tondare, John Henry J Scott, et al.
Nanotechnology|August 10, 2011
An electron microscopy investigation of the structure of porous silicon by oxide replicationVipin N Tondare, Brian C Gierhart, David G Howitt, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|April 25, 2022
A Concept for Three-Dimensional Particle Metrology Based on Scanning Electron Microscopy and Structure-from-Motion PhotogrammetryVipin N Tondare
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2017
Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) StereophotogrammetryVipin N Tondare, John S Villarrubia, András E Vladár
CIRP Annals ... Manufacturing Technology|November 14, 2024
Uncertainty of particle size measurements using dynamic image analysis<sup>☆</sup>Justin G Whiting, Vipin N Tondare, John Henry J Scott, et al.
Nanotechnology|August 10, 2011
An electron microscopy investigation of the structure of porous silicon by oxide replicationVipin N Tondare, Brian C Gierhart, David G Howitt, et al.
Pageof 1