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Vladimir P Oleshko

Showing results (1-10 of 23) with videos related to

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Journal of Nanoscience and Nanotechnology|February 21, 2013
The use of plasmon spectroscopy and imaging in a transmission electron microscope to probe physical properties at the nanoscaleVladimir P Oleshko
Journal of Electron Microscopy|December 8, 2004
Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscaleJames M Howe, Vladimir P Oleshko
Ultramicroscopy|September 28, 2011
Are electron tweezers possible?Vladimir P Oleshko, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Use of plasmon spectroscopy to evaluate the mechanical properties of materials at the nanoscaleVladimir P Oleshko, Mitsuhiro Murayama, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2023
Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk StandardsNicholas W M Ritchie, Andrew Herzing, Vladimir P Oleshko
Journal of Membrane Science|June 7, 2021
Thickness-Dependent Permeance of Molecular Layer-By-Layer Polyamide MembranesWilliam D Mulhearn, Vladimir P Oleshko, Christopher M Stafford
Journal of Nanoscience and Nanotechnology|December 2, 2004
High-resolution and analytical TEM investigation of metastable-tetragonal phase stabilization in undoped nanocrystalline zirconiaVladimir P Oleshko, James M Howe, Satyajit Shukla, et al.
RSC Advances|April 15, 2022
Investigation of the excitations of plasmons and surface exciton polaritons in monoclinic gadolinium sesquioxide by electron energy-loss spectroscopy and plasmon spectroscopic imagingSz-Chian Liou, Vladimir P Oleshko, W Chun-Hsin Kuo, et al.
ACS Nano|July 9, 2019
Direct-Write Lithiation of Silicon Using a Focused Ion Beam of Li<sup></sup>William R McGehee, Evgheni Strelcov, Vladimir P Oleshko, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|June 16, 2017
Multimodal Characterization of the Morphology and Functional Interfaces in Composite Electrodes for Li-S Batteries by Li Ion and Electron BeamsVladimir P Oleshko, Andrew A Herzing, Kevin A Twedt, et al.
Pageof 3

Showing results (1-10 of 23) with videos related to

Sort By:
Pageof 3
Journal of Nanoscience and Nanotechnology|February 21, 2013
The use of plasmon spectroscopy and imaging in a transmission electron microscope to probe physical properties at the nanoscaleVladimir P Oleshko
Journal of Electron Microscopy|December 8, 2004
Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscaleJames M Howe, Vladimir P Oleshko
Ultramicroscopy|September 28, 2011
Are electron tweezers possible?Vladimir P Oleshko, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Use of plasmon spectroscopy to evaluate the mechanical properties of materials at the nanoscaleVladimir P Oleshko, Mitsuhiro Murayama, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2023
Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk StandardsNicholas W M Ritchie, Andrew Herzing, Vladimir P Oleshko
Journal of Membrane Science|June 7, 2021
Thickness-Dependent Permeance of Molecular Layer-By-Layer Polyamide MembranesWilliam D Mulhearn, Vladimir P Oleshko, Christopher M Stafford
Journal of Nanoscience and Nanotechnology|December 2, 2004
High-resolution and analytical TEM investigation of metastable-tetragonal phase stabilization in undoped nanocrystalline zirconiaVladimir P Oleshko, James M Howe, Satyajit Shukla, et al.
RSC Advances|April 15, 2022
Investigation of the excitations of plasmons and surface exciton polaritons in monoclinic gadolinium sesquioxide by electron energy-loss spectroscopy and plasmon spectroscopic imagingSz-Chian Liou, Vladimir P Oleshko, W Chun-Hsin Kuo, et al.
ACS Nano|July 9, 2019
Direct-Write Lithiation of Silicon Using a Focused Ion Beam of Li<sup></sup>William R McGehee, Evgheni Strelcov, Vladimir P Oleshko, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|June 16, 2017
Multimodal Characterization of the Morphology and Functional Interfaces in Composite Electrodes for Li-S Batteries by Li Ion and Electron BeamsVladimir P Oleshko, Andrew A Herzing, Kevin A Twedt, et al.
Pageof 3