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The Review of Scientific Instruments|December 3, 2008
Quantitative model for near-field scanning microwave microscopy: application to metrology of thin film dielectricsAlexander N Reznik, Vladimir V Talanov
ACS Nano|June 12, 2010
Few-layer graphene characterization by near-field scanning microwave microscopyVladimir V Talanov, Christopher Del Barga, Lee Wickey, et al.
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