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Journal of Microscopy
|
October 25, 2006
Microstructural characterization of nitrided Timetal 834
T Moskalewicz, W Grogger, A Czyrska-Filemonowicz
Micron (Oxford, England : 1993)
|
August 30, 2008
Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range
B Schaffer, K Riegler, G Kothleitner, et al.
Ultramicroscopy
|
July 23, 2003
Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution
C Mitterbauer, G Kothleitner, W Grogger, et al.
Analytical and Bioanalytical Chemistry
|
October 24, 2007
AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors
A Fian, A Haase, B Stadlober, et al.
Micron (Oxford, England : 1993)
|
March 23, 2006
Cerenkov losses: a limit for bandgap determination and Kramers-Kronig analysis
M Stöger-Pollach, H Franco, P Schattschneider, et al.
Physical Review Letters
|
June 1, 2001
Direct evidence for block-by-block growth in high-temperature superconductor ultrathin films
M Varela, W Grogger, D Arias, et al.
The Review of Scientific Instruments
|
June 3, 2010
Note: On the deconvolution of Kelvin probe force microscopy data
A Blümel, H Plank, A Klug, et al.
Journal of Nanoscience and Nanotechnology
|
April 1, 2006
Single crystalline nature of para-sexiphenyl crystallites grown on KCl(100)
T Haber, M Oehzelt, R Resel, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 8) with videos related to
Sort By:
Page
of 1
Journal of Microscopy
|
October 25, 2006
Microstructural characterization of nitrided Timetal 834
T Moskalewicz, W Grogger, A Czyrska-Filemonowicz
Micron (Oxford, England : 1993)
|
August 30, 2008
Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range
B Schaffer, K Riegler, G Kothleitner, et al.
Ultramicroscopy
|
July 23, 2003
Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution
C Mitterbauer, G Kothleitner, W Grogger, et al.
Analytical and Bioanalytical Chemistry
|
October 24, 2007
AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors
A Fian, A Haase, B Stadlober, et al.
Micron (Oxford, England : 1993)
|
March 23, 2006
Cerenkov losses: a limit for bandgap determination and Kramers-Kronig analysis
M Stöger-Pollach, H Franco, P Schattschneider, et al.
Physical Review Letters
|
June 1, 2001
Direct evidence for block-by-block growth in high-temperature superconductor ultrathin films
M Varela, W Grogger, D Arias, et al.
The Review of Scientific Instruments
|
June 3, 2010
Note: On the deconvolution of Kelvin probe force microscopy data
A Blümel, H Plank, A Klug, et al.
Journal of Nanoscience and Nanotechnology
|
April 1, 2006
Single crystalline nature of para-sexiphenyl crystallites grown on KCl(100)
T Haber, M Oehzelt, R Resel, et al.
Page
of 1