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Science (New York, N.Y.)|January 30, 1987
Focal points in mass spectrometryW N Delgass, R G Cooks
The Review of Scientific Instruments|November 1, 1979
Instrument combining x-ray photoelectron spectroscopy and secondary ion mass spectrometry for surface studiesR W Hewitt, A T Shepard, W E Baitinger, et al.
Physical Review Letters|March 5, 2009
Oxygen-coverage effects on molecular dissociations at a Pt metal surfaceR B Getman, W F Schneider, A D Smeltz, et al.
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