Related Experiment Video
Updated: Jul 2, 2026

Analysis of Complex Molecules and Their Reactions on Surfaces by Means of Cluster-Induced Desorption/Ionization Mass Spectrometry
Published on: March 1, 2020
Instrument combining x-ray photoelectron spectroscopy and secondary ion mass spectrometry for surface studies
R W Hewitt1, A T Shepard, W E Baitinger
1Department of Chemistry, Purdue University, West Lafayette, Indiana 47907, USA.
Abstract:
X-ray Photoelectron Spectroscopy (XPS) or (ESCA) and Secondary Ion Mass Spectrometry (SIMS) have been combined in the same ultrahigh vacuum system to facilitate a new approach to studying clean and reacted surfaces. The design philosophy is to connect two satellite vacuum systems via a set of magnetically driven sample transfer devices. The advantages and capabilities of this approach are discussed with respect to its flexibility and its ability to couple to other surface techniques. XPS and static SIMS spectra of an oxidized polycrystalline indium film are presented to exemplify the type of information which can be gleaned from a multitechnique investigation of surfaces. The additional ability to prepare sample surfaces in our system by ion implantation is demonstrated by a positive-ion SIMS analysis of a gold-implanted aluminum foil.
Related Concept Videos
Tandem Mass Spectrometry
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Mass Spectrometers
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Atomic Emission Spectroscopy: Instrumentation

