Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

W T Pawlewicz

Showing results (1-10 of 6) with videos related to

Pageof 1
Sort By:
Applied Optics|June 15, 1984
Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatingsG J Exarhos, W T Pawlewicz
Applied Optics|August 31, 2010
Thermal conductivities of thin, sputtered optical filmsC H Henager, W T Pawlewicz
Applied Optics|April 1, 1997
Optical and durability properties of infrared transmitting thin filmsJ D Traylor Kruschwitz, W T Pawlewicz
Applied Optics|June 15, 1983
Structural characterization of TiO2 optical coatings by Raman spectroscopyW T Pawlewicz, G J Exarhos, W E Conaway
Applied Optics|May 8, 2010
Relative importance of surface and volume scattering in all-dielectric mirrorsJ W Griffin, K A Stahl, B S Matson, et al.
Applied Optics|May 22, 2010
Interference-enhanced Raman scattering from Ti0(2)/Si0(2) multilayers: measurement and theoryR A Craig, G J Exarhos, W T Pawlewicz, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Applied Optics|June 15, 1984
Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatingsG J Exarhos, W T Pawlewicz
Applied Optics|August 31, 2010
Thermal conductivities of thin, sputtered optical filmsC H Henager, W T Pawlewicz
Applied Optics|April 1, 1997
Optical and durability properties of infrared transmitting thin filmsJ D Traylor Kruschwitz, W T Pawlewicz
Applied Optics|June 15, 1983
Structural characterization of TiO2 optical coatings by Raman spectroscopyW T Pawlewicz, G J Exarhos, W E Conaway
Applied Optics|May 8, 2010
Relative importance of surface and volume scattering in all-dielectric mirrorsJ W Griffin, K A Stahl, B S Matson, et al.
Applied Optics|May 22, 2010
Interference-enhanced Raman scattering from Ti0(2)/Si0(2) multilayers: measurement and theoryR A Craig, G J Exarhos, W T Pawlewicz, et al.
Pageof 1